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46 results

Conference Proceedings

1. Improvement of the iterative Fourier transform algorithm for phase retrieval

Itoh,K. ; Takajo,H. ; Takahashi,T.

Pub. info.:	Optical engineering for sensing and nanotechnology (ICOSN 2001) : 6-8 June 2001, Yokohama, Japan. pp.372-375, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4416

Conference Proceedings

2. Measurement of total integrated scatter of optical coatings for 157-nm lithography

Saito,T. ; Saito,J. ; Nakamura,E. ; Kudo,T. ; Kagaya,M. ; Takahashi,T.

Pub. info.:	Optical metrology roadmap for the semiconductor, optical, and data storage industries II : 2-3 August 2001 San Diego, USA. pp.22-29, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4449

Conference Proceedings

3. Laser-diode joint-transform correlator with a digital interferometric technique

Ishii,Y. ; Takahashi,T.

Pub. info.:	Optical engineering for sensing and nanotechnology (ICOSN 2001) : 6-8 June 2001, Yokohama, Japan. pp.252-255, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4416

Conference Proceedings

4. Global wavefront reconstruction from its image in focal plane and Shack-Hartmann sensor images

Takahashi,T. ; Takajo,H.

Pub. info.:	Optical engineering for sensing and nanotechnology (ICOSN '99) : 16-18 June 1999, Yokohama, Japan. pp.160-163, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3740

Conference Proceedings

5. Spectrum-enhanced correlator by two-wave mixing in a photorefractive crystal

Takahashi,T. ; Ishii,Y.

Pub. info.:	Optical engineering for sensing and nanotechnology (ICOSN '99) : 16-18 June 1999, Yokohama, Japan. pp.169-172, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3740

Conference Proceedings

6. Micropattern fabrication by a specialty designed microtool

Aoki,I. ; Takahashi,T.

Pub. info.:	Micromachining and microfabrication process technology V : 20-22 September, 1999, Santa Clara, California. pp.365-372, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3874

Conference Proceedings

7. Image reconstruction from its Fourier modulus

Takahashi,T. ; Takajo,H.

Pub. info.:	18th Congress of the International Commission for Optics : Optics for the next millennium : 2-6 August, 1999, San Francisco, California. pp.352-353, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3749

Conference Proceedings

8. Blind Deconvolution by Iterative Fourier Transform Algorithms,

Takahashi,T. ; Takajo,H. ; Maki,H. ; Dainty,J.C.

Pub. info.:	Optics for science and new technology : 17th Congress of the International Commission for Optics, August 19-23, 1996, Hotel Riviera(Yusong), Taejon Korea. Part1 pp.517-518, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2778

Conference Proceedings

9. Properties of sputter-deposited Fe-Pd thin films

Wang,Z. ; Iijima,T. ; He,G. ; Takahashi,T. ; Oikawa,K. ; Furuya,Y.

Pub. info.:	Smart materials. pp.284-291, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4234

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Conference Proceedings

10. Laser-diode phase-shifting interferometer applied to joint-transform correlator

Takahashi,T. ; Ishii,Y.

Pub. info.:	Laser interferometry X : techniques and analysis : 31 July-1 August 2000, Sandiego, USA. Part A pp.4-11, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4101

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