1.

Conference Proceedings
Conference Proceedings
1. Spatial Distribution of Microdefects around Dislocations in Si-Doped GaAs
Toba,R. ; Warashina,M. ; Tajima,M.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1785-1790,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
2.

Conference Proceedings
Conference Proceedings
2. Characterization of Deep Levels in SiC by Photoluminescence Spectroscopy and Mapping
Tajima,M. ; Kumagaya,Y. ; Nakata,T. ; Inoue,M. ; Nakamura,A.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part1  pp.481-484,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
3.

Conference Proceedings
Conference Proceedings
3. Photoluminescence of Ring-Distribution of Oxygen Precipitates in Czochralski Silicon
Terashima,K. ; Ikarashi,T. ; Ono,H. ; Tajima,M.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1129-1134,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
4.

Conference Proceedings
Conference Proceedings
4. Luminescence due to electron-hole condensation in silicon-on-insulator and its application to defect and interface characterization
Tajima,M. ; Ibuka,S. ; Warashina,M.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1731-1736,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
5.

Conference Proceedings
Conference Proceedings
5. Role of Point Defects in Oxygen Agglomeration in Si
Tajima,M. ; Takeno,H. ; Warashina,M. ; Abe,T.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.147-152,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
6.

Conference Proceedings
Conference Proceedings
6. Photoluminescence due to Oxygen Precipitates Distinguished from the D Lines in Annealed Si
Tajima,M. ; Tokita,M. ; Warashina,M.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1749-1754,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201