1.

Conference Proceedings
Conference Proceedings
1. Characterization of SiC Wafers by Photohlminescence Mapping
Tajima, M. ; Higashi, E. ; Hayashi, T. ; Kinoshita, H. ; Shiomi, H.
Pub. info.: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.711-716,  2006.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 527-529
2.

Conference Proceedings
Conference Proceedings
2. Advanced process control for deep sub-100nm gate fabrication
Goto, T. K. ; Tajima, M. ; Harada, F. ; Kato, T. ; Yamazaki, T. ; Taguchi, T.
Pub. info.: Data analysis and modeling for process control II : 3-4 March, 2005, San Jose, California, USA.  pp.18-28,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5755
3.

Conference Proceedings
Conference Proceedings
3. SCANNING OPTICAL FIBER MICROSCOPE FOR HIGH RESOLUTION LASER BEAM INDUCED CURRENT IMAGES OF SEMICONDUCTOR MATERIALS
Ogura, M. ; Tajima, M. ; Tokumaru, Y.
Pub. info.: Materials characterization : symposium held April 15-17, 1986, Palo Alto California, U.S.A..  pp.251-256,  1986.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 69
4.

Conference Proceedings
Conference Proceedings
4. HIGH QUALITY GaP GROWTH ON Si SUBSTRATES BY MOCVD
Uchida, K. ; Kohama, Y. ; Tajima, M. ; Soga, T. ; Jimbo, T. ; Umeno, M.
Pub. info.: Heteroepitaxy on silicon : fundamentals, structure, and devices : symposium held April 5-8, 1988, Reno, Nevada, U.S.A..  pp.319-324,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 116
5.

Conference Proceedings
Conference Proceedings
5. On-Orbit Operations of NiMH Cells for Space Applications
Iwabuchi, T. ; Ishikawa, Y. ; Inafuku, H. ; Takahashi, K. ; Hirose, K. ; Tajima, M. ; Adachi, M. ; Kudoh, M.
Pub. info.: Proceedings of the Sixth European Space Power Conference (ESPC) : 6-10 May 2002, Porto, Portugal.  pp.635-640,  2002.  Noordwijk.  ESA Publications Division
Title of ser.: ESA SP
Ser. no.: 502
6.

Conference Proceedings
Conference Proceedings
6. INVITED: CHARACTERIZATION OF SOI WAFERS BY PHOTOLUMINESCENCE
Tajima, M. ; Ibuka, S.
Pub. info.: Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology.  pp.815-828,  2002.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-2
7.

Conference Proceedings
Conference Proceedings
7. Characterization of Hole Trapping in Ultra- Thin Chemical Oxides by Means of X-Ray Photoelectron Spectroscopy Time- Dependent Measurements
Hagimoto, V. ; Fujita, T. ; Ono, K. ; Fujioka, H. ; Oshima, M. ; Hirose, K. ; Tajima, M.
Pub. info.: Silicon nitride and silicon dioxide thin insulating films, proceedings of the fifth International Symposium.  pp.134-142,  1999.  Pennington, New Jersey.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-6
8.

Conference Proceedings
Conference Proceedings
8. Molecular Sieve Effect of Chemically Modified Na-A Type Zeolite and Its Molecular Dynamic Simulation
Izumi, J. ; Yasutake, A. ; Tomonaga, N. ; Oka, N. ; Ota, H. ; Akutsu, N. ; Umeda, S. ; Tajima, M.
Pub. info.: Progress in zeolite and microporous materials : proceedings of the 11th International Zeolite Conference, Seoul, Korea, August 12-17, 1996.  C  pp.2315-,  1997.  Amsterdam.  Elsevier
Title of ser.: Studies in surface science and catalysis
Ser. no.: 105
9.

Conference Proceedings
Conference Proceedings
9. Macroscopic and Microscopic Photoluminescence Mapping System Applicable to 300 mm Wafers
Li, Z. ; Tajima, M. ; Shimidzu, R.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah.  pp.322-328,  2003.  Pennington, NJ.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5133
10.

Conference Proceedings
Conference Proceedings
10. Characterization of SOI wafers by photoluminescence spectroscopy, decay and micro/macro-mapping
Tajima, M.
Pub. info.: Silicon-on-insulator technology and devices XI : proceedings of the international symposium.  pp.413-424,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-5