1.

Conference Proceedings

Conference Proceedings
L. Liu ; Z.J. Li ; S. Sun ; T. You ; X.T. Qi ; K. Song
Pub. info.: IUMRS International Conference in Asia.  pp.1539-1544,  2017.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 898
2.

Technical Paper

Technical Paper
T. You ; A. Halsell ; E. Graat ; S. Demcak ; D. Highsmith ; S. Long ; R. Bhat ; N. Mottinger ; E. Higa ; M. Jah
Pub. info.: AIAA meeting papers on disc.  2007.  Reston, Va..  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA Space Conference and Exposition
Ser. no.: 2007
3.

Technical Paper

Technical Paper
D. Highsmith ; T. You ; S. Demcak ; E. Graat ; E. Higa ; S. Long ; R. Bhat ; N. Mottinger ; A. Halsell ; F. Peralta
Pub. info.: AIAA meeting papers on disc.  2008.  Reston, Va..  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : Astrodynamics Specialist Conference
Ser. no.: 2008
4.

Conference Proceedings

Conference Proceedings
T. You ; J. Yu ; X. Yu
Pub. info.: Fourth International Symposium on Precision Mechanical Measurements.  1  pp.71302O-1-71302O-6,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 7130
5.

Conference Proceedings

Conference Proceedings
H. Shin ; T. You ; M. Yoo ; J. Choi ; K. Yang
Pub. info.: Lithography Asia 2008.  2  pp.714034-1-714034-7,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 7140
6.

Conference Proceedings

Conference Proceedings
J. Yoon ; K. Kim ; N. Kong ; H. Kim ; T. You ; S. Jung ; G. Han ; M. Lim ; H. Shin ; I. Chung
Pub. info.: Color imaging XII : processing, hardcopy, and applications : 30 January-1 February 2007, San Jose, California, USA.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6493