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13 results

Conference Proceedings

1. Pulsed EPR Studies of the T_v2a Center in 4H-SiC

J. Isoya ; T. Umeda ; N. Mizuochi ; T. Ohshima

Pub. info.:	Silicon carbide and related materials 2008 : selected peer reviewed papers from the 7th European Conference on Silicon Carbide and Related Materials, September 7-11 Barcelona, Spain. pp.353-356, 2009. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	615-617

Conference Proceedings

2. Identification of the Negative Di-Carbon Antisite Defect in n-Type 4H-SiC

A. Gali ; T. Umeda ; E. Janzen ; N. Morishita ; T. Ohshima

Pub. info.:	Silicon carbide and related materials 2008 : selected peer reviewed papers from the 7th European Conference on Silicon Carbide and Related Materials, September 7-11 Barcelona, Spain. pp.361-364, 2009. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	615-617

Conference Proceedings

3. Electrically Detected Magnetic Resonance (EDMR) Studies of SiC-SiO₂ Interfaces

T. Umeda ; R. Kosugi ; K. Fukuda ; N. Morishita ; T. Ohshima

Pub. info.:	Silicon carbide and related materials 2011 : selected, peer reviewed papers from the 14th International Conference on Silicon Carbide and Related Materials 2011 (ICSCRM 2011), September 11-16, 2011, Cleveland, Ohio, USA. pp.427-432, 2012. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	717-720

Conference Proceedings

4. Photo-EPR Study of Vacancy-Type Defects in Irradiated n-Type 4H-SiC

T. Umeda ; N. Morishita ; T. Ohshima ; H. Itoh ; J. Isoya

Pub. info.:	Silicon carbide and related materials 2007 : selected peer reviewed papers from the International Conference on Silicon Carbide and Related Materials 2007, Otsu Prince Hotel Covention Hall, Lake Biwa Resort, Otsu, Japan, October 14-19, 2007. pp.409-412, 2009. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	600-603

Conference Proceedings

5. Electrically Detected ESR Study of Interface Defects in 4H-SiC Metal-Oxide-Semiconductor Field Effect Transistor

T. Umeda ; K. Esaki ; R. Kosugi ; K. Fukuda ; N. Morishita

Pub. info.:	Silicon Carbide and Related Materials 2010 : Selected, peer reviewed papers from the 8th European Conference on Silicon Carbide and Related Materials (ECSCRM 2010), held in Oslo (Sundvolden Conference Centre), Norway, August 29th - September 2nd. pp.370-373, 2011. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	679-680

Conference Proceedings

6. Effect of Fe Content on Hot Tearing of High-Strength Al-Mg-Si Alloy

H. Nagaum ; S. Suzuki ; T. Okane ; T. Umeda

Pub. info.:	THERMEC 2006 : supplement to THERMEC 2006, 5th International conference on processing and manufacturing of advanced materials, July 4-8, 2006, Vancouver, Canad. 539-543 pp.380-385, 2007. Stafa-Zuerich. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	539-543(1)

Conference Proceedings

7. Electron Paramagnetic Resonance Study of Carbon Antisite-Vacancy Pair in p-Type 4H-SiC

T. Umeda ; N. Morishita ; T. Ohshima ; H. Itoh ; J. Isoya

Pub. info.:	Silicon carbide and related materials 2006 : ECSCRM 2006, Proceedings of the 6th European Conference on Silicon Carbide and Related Materials, Newcastle upon Tyne, UK, September 2006. pp.453-456, 2007. Stafa-Zuerich. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	556-557

Conference Proceedings

8. Deep Acceptor Levels of the Carbon Vacancy-Carbon Antisite Pairs in 4H-SiC

P. Carlsson ; N.T. Son ; T. Umeda ; J. Isoya ; E. Janzen

Pub. info.:	Silicon carbide and related materials 2006 : ECSCRM 2006, Proceedings of the 6th European Conference on Silicon Carbide and Related Materials, Newcastle upon Tyne, UK, September 2006. pp.449-452, 2007. Stafa-Zuerich. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	556-557

Conference Proceedings

9. EPR Identification of Defects and Impurities in SiC: To be Decisive

J. Isoya ; T. Umeda ; N. Mizuochi ; N.T. Son ; E. Janzén

Pub. info.:	Silicon carbide and related materials 2007 : selected peer reviewed papers from the International Conference on Silicon Carbide and Related Materials 2007, Otsu Prince Hotel Covention Hall, Lake Biwa Resort, Otsu, Japan, October 14-19, 2007. pp.279-284, 2009. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	600-603

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Conference Proceedings

10. Mask protection from a haze during shipping and storage

T. Umeda ; H. Kawashima ; T. Miho ; K. Moriya

Pub. info.:	Photomask technology 2007. 3 pp.67304Q-1-67304Q-11, 2007. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6730

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Author: T. Umeda