1.

Conference Proceedings
Conference Proceedings
1. Modeling of non-uniform device geometries for post-lithography circuit analysis [6156-54]
Gupta, P. ; Kahng, A. ; Kim, Y. ; Shah, S. ; Sylvester, D.
Pub. info.: Design and process integration for microelectronic manufacturing IV : 23-24 February, 2006, San Jose, California, USA.  pp.61560U-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6156
2.

Conference Proceedings
Conference Proceedings
2. Layout verification and optimization based on flexible design rules [6156-09]
Yang, J. ; Capodieci, L. ; Sylvester, D.
Pub. info.: Design and process integration for microelectronic manufacturing IV : 23-24 February, 2006, San Jose, California, USA.  pp.61560A-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6156
3.

Conference Proceedings
Conference Proceedings
3. Self-compensating design for reduction of timing and leakage sensitivity to systematic pattern dependent variation [6156-10]
Gupta, P. ; Kahng, A. B. ; Kim, Y. ; Sylvester, D.
Pub. info.: Design and process integration for microelectronic manufacturing IV : 23-24 February, 2006, San Jose, California, USA.  pp.61560B-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6156
4.

Conference Proceedings
Conference Proceedings
4. Advanced timing analysis based on post-OPC patterning process simulations
Yang, J. ; Capodieci, L. ; Sylvester, D.
Pub. info.: Design and process integration for microelectronic manufacturing III : 3-4 March 2005, San Jose, California, USA.  pp.189-197,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5756
5.

Conference Proceedings
Conference Proceedings
5. Toward performance-driven reduction of the cost of RET-based lithography control (Invited Paper)
Gupta, P. ; Kahng, A.B. ; Sylvester, D. ; Yang, J.
Pub. info.: Cost and performance in integrated circuit creation : 27-28 February 2003, Santa Clara, California, USA.  pp.123-133,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5043