1.

Conference Proceedings

Conference Proceedings
Takano,H. ; Suzuki,Y. ; Uesugi,K. ; Takeuchi,A. ; Yagi,N.
Pub. info.: X-ray and micro- and nano-focusing : applications and techniques : 31 July 2001 San Diego, USA.  pp.126-133,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4499
2.

Conference Proceedings

Conference Proceedings
Takeuchi,A. ; Takano,H. ; Uesugi,K. ; Suzuki,Y.
Pub. info.: X-ray and micro- and nano-focusing : applications and techniques : 31 July 2001 San Diego, USA.  pp.29-37,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4499
3.

Conference Proceedings

Conference Proceedings
Suzuki,Y. ; Takeuchi,A. ; Takano,H. ; Ohigashi,T. ; Takenaka,H.
Pub. info.: X-ray and micro- and nano-focusing : applications and techniques : 31 July 2001 San Diego, USA.  pp.74-84,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4499
4.

Conference Proceedings

Conference Proceedings
Kohmura,Y. ; Suzuki,Y. ; Dudchik,Yu.I. ; Kolchevsky,N.N. ; Komarov,F.F.
Pub. info.: X-ray mirrors, crystals, and multilayers : 30-31 July 2001 San Diego, USA.  pp.99-105,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4501
5.

Conference Proceedings

Conference Proceedings
Uesugi,K. ; Suzuki,Y. ; Yagi,N. ; Tsuchiyama,A. ; Nakano,T.
Pub. info.: Developments in x-ray tomography III : 2-3 August 2001, San Diego, USA.  pp.291-298,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4503
6.

Conference Proceedings

Conference Proceedings
Suzuki,Y. ; Yagi,N. ; Umetani,K. ; Kohmura,Y. ; Yamasaki,K.
Pub. info.: Medical applications of penetrating radiation : 22-23 July 1999, Denver, Colorado.  pp.13-22,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3770
7.

Conference Proceedings

Conference Proceedings
Aizu,Y. ; Asakura,T. ; Ogino,K. ; Sugita,T. ; Suzuki,Y. ; Masuda,K.
Pub. info.: Proceedings of optical diagnostics of living cells and biofluids : 28 January-1 February 1996, San Jose, California.  pp.360-371,  1996.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2678
8.

Conference Proceedings

Conference Proceedings
Petrov,A.V. ; Yin,S. ; Yu,F.T.S. ; Leonov,O.B. ; Suzuki,Y. ; Shinoda,K.K.
Pub. info.: Photorefractive fiber and crystal devices : materials, optical properties, and applications III : 28-29 July, 1997, San Diego, California.  pp.183-188,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3137
9.

Conference Proceedings

Conference Proceedings
Suzuki,Y.
Pub. info.: Optical memory and neural networks : optical information science & technology '97 : 27-30 August 1997, Moscow, Russia.  pp.170-173,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3402
10.

Conference Proceedings

Conference Proceedings
Uesugi,K. ; Tsuchiyama,A. ; Nakano,T. ; Suzuki,Y. ; Yagi,N. ; Umetani,K. ; Kohmura,Y.
Pub. info.: Developments in X-ray tomography II : 22-23 July 1999, Denver, Colorado.  pp.214-221,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3772