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34 results

Conference Proceedings

1. Photoexcitation of Defects Related to B in GaAs

Suezawa,M. ; Sumino,K.

Pub. info.:	Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993. Pt.2 pp.1281-1285, 1994. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	143-147

Conference Proceedings

2. Oxygen Precipitation in CZ Silicon Crystals Contaminated with Iron

Jablonski,J. ; Shen,B. ; Mchedlidze,T.R. ; Imai,M. ; Sumino,K.

Pub. info.:	Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.1859-1864, 1995. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	196-201

Conference Proceedings

3. < 100 >and< 111 >configurations of iron-acceptor pairs in silicon related to stable and metastable states

Takahashi,H. ; Suezawa,M. ; Sumino,K.

Pub. info.:	Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991. Pt.1 pp.155-160, 1992. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	83-87

Conference Proceedings

4. Annealing Processes of Vacancies in Silicon Induced by Electron Irradiation:Analysis Using Positron Lifetime Measurement

Kawasuso,A. ; Hasegawa,M. ; Suezawa,M. ; Yamaguchi,S. ; Sumino,K.

Pub. info.:	Positron annihilation : ICPA-10 : Proceedings of the 10th International Conference on Positron Annihilation, May 23-29, 1994, Beijing, China. Part1 pp.423-426, 1995. Aederlmannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	175-178

Conference Proceedings

5. Subsurface Damage in Single Diamond Tool Machined Si Wafers

Mchedlidze,T.R. ; Yonenaga,I. ; Sumino,K.

Pub. info.:	Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.1841-1846, 1995. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	196-201

Conference Proceedings

6. Optical Absorption Lines in Heat-Treated GaAs

Suezawa,M. ; Sumino,K.

Pub. info.:	Shallow Impurities in Semiconductors : Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August, 1992. pp.357-362, 1993. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	117-118

Conference Proceedings

7. Positron-Annihilation 2D-ACAR Study of Divacancy and Vacancy-Oxygen Pairs in Si

Hasegawa,M. ; Chiba,T. ; Kawasuso,A. ; Akahane,T. ; Suezawa,M. ; Yamaguchi,S. ; Sumino,K.

Pub. info.:	Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.1481-1490, 1995. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	196-201

Conference Proceedings

8. Effect of Impurities on Dislocation Activity in GaAs

Yonenaga,I. ; Sumino,K.

Pub. info.:	Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988. Part3 pp.1385-1390, 1989. Aederlmannsdorf, Switzwelns. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	38-41

Conference Proceedings

9. Optical Absorption due to Vibration of Hydrogen-Oxygen Pairs in Silicon

Markevich,V.P. ; Suezawa,M. ; Sumino,K.

Pub. info.:	Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.915-920, 1995. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	196-201

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Conference Proceedings

10. Dislocation activities in bulk GeSi crystals

Yonenaga,I. ; Sumino,K.

Pub. info.:	Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part1 pp.159-164, 1997. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	258-263

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