1.

Conference Proceedings

Conference Proceedings
Mizeikis,V. ; Jarasiunas,K. ; Storasta,J. ; Gudelis.V. ; Bastiene,L. ; Sudzius,M.
Pub. info.: International Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro-, and Quantum Electronics : 13-15 May 1997, Kiev, Ukraine.  pp.163-170,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3359
2.

Conference Proceedings

Conference Proceedings
Dignam,M. ; Kohler,K. ; Leo,K. ; Litvinenko,K. ; Loser,F. ; Lyssenko,V.G. ; Sudzius,M. ; Valusis,G.
Pub. info.: Ultrafast phenomena in semiconductors : proceedings of the 10th International Symposium on Ultrafast Phenomena in Semiconductors (10-UFPS), held in Vilnius, Lithuania, August/September, 1998.  pp.11-16,  1999.  Zurich-Uetikon, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 297-298
3.

Conference Proceedings

Conference Proceedings
Sudzius,M. ; Lyssenko,V.G. ; Loser,F. ; Valusis,G. ; Hasche,T. ; Leo,K. ; Dignam,M.M. ; Kohler,K.
Pub. info.: Ultrafast Phenomena in Semiconductors II.  pp.88-96,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3277
4.

Conference Proceedings

Conference Proceedings
Sudzius,M. ; Bastiene,L. ; Jarasiunas,K.
Pub. info.: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics.  pp.232-238,  1995.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2648
5.

Conference Proceedings

Conference Proceedings
Jarasiunas,K. ; Sudzius,M. ; Subacius,L. ; Simkiene,I. ; Mizeikis,V.
Pub. info.: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics.  pp.226-231,  1995.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2648