1.

Conference Proceedings
Conference Proceedings
1. QUANTITATIVE DISTRIBUTION ANALYSIS OF PHOSPORUS WITH SIMS IN THE LAYER SYSTEM SiO2/Si
Stingeder, G. ; Traxlmayr, U. ; Guerrero, E. ; Grasserbauer, M. ; Potzl, H.
Pub. info.: Materials characterization : symposium held April 15-17, 1986, Palo Alto California, U.S.A..  pp.329-336,  1986.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 69
2.

Conference Proceedings
Conference Proceedings
2. SIMULATION OF BURIED LAYER EXPERIMENTS CONTAIN- ING ALL FOUR DOPANT SPECIES
Ghaderi, K. ; Hobler, G. ; Budil, M. ; Poetzl, H. ; Pichler, P. ; Ryssel, H. ; Hansch, W. ; Eisele, I. ; Tian, C. ; Stingeder, G.
Pub. info.: Proceedings of the Seventh International Symposium on Silicon Materials Science and Technology.  pp.613-624,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-10