Meyer, B.K. ; Hofmann, D.F. ; Oettinger, K. ; Stadler, W. ; Efros, Al. L. ; Salk, M. ; Benz, K.W.
Pub. info.:
Wide band gap semiconductors : symposium held December 2-6, 1991, Boston, Massachusetts, U.S.A.. pp.209-214, 1992. Pittsburgh, Pa.. Materials Research Society
Meyer, B.K. ; Hofmann, D.M. ; Stadler, W. ; Emanuelsson, P. ; Omling, P. ; Weigel, E. ; Muller-Vogt, G. ; Wienecke, F. ; Schenk, M.
Pub. info.:
Infrared detectors : materials, processing, and devices : symposium held April 14-16, 1993, San Francisco, California, U.S.A.. pp.185-190, 1994. Pittsburgh, PA. Materials Research Society
Stadler, W. ; Meyer, B.K. ; Hofmann, D.M. ; Sinerius, D. ; Benz, K.W.
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Defects in materials : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A.. pp.445-450, 1991. Pittsburgh, Pa.. Materials Research Society
Meyer, B. K. ; Hofmann, D. M. ; Christmann, P. ; Stadler, W. ; Nikolov, A. ; Scharmann, A. ; Hofstaetter, A.
Pub. info.:
Microcrystalline and nanocrystalline semiconductors : Symposium held November 29-December 2, 1994, Boston, Massachusetts, U.S.A.. pp.453-, 1995. Pittsburgh, Pa.. MRS - Materials Research Society
Meyer, B. K. ; Hofmann, D. M. ; Stadler, W. ; Emanuelsson, P. ; Omling, P. ; Weigel, E. ; Muller-Vogt, G. ; Wienecke, F. ; Schenk, M.
Pub. info.:
Semiconductors for room-temperature radiation detector applications : symposium held April 12-16, 1993, San Francisco, California, U.S.A.. pp.433-, 1993. Pittsburgh, Pa.. MRS - Materials Research Society
Stadler, W. ; Hallen, A. ; Osterman, J. ; Zimmermann, U. ; Svensson, B.G.
Pub. info.:
Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001. pp.1309-1312, 2002. Zuerich, Switzerland. Trans Tech Publications
Meyer, B.K. ; Christmann, P. ; Stadler, W. ; Overhof, H. ; Spaeth, J-M. ; Greulich-Weber, S. ; Stich, B.
Pub. info.:
Proceedings of the Symposium on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects. pp.221-234, 1994. Pennington, NJ. Electrochemical Society
Meyer, B. K. ; Hofmann, D. M. ; Stadler, W. ; Salk, M. ; Eiche, C. ; Benz, K. W.
Pub. info.:
Semiconductors for room-temperature radiation detector applications : symposium held April 12-16, 1993, San Francisco, California, U.S.A.. pp.189-, 1993. Pittsburgh, Pa.. MRS - Materials Research Society