1.

Conference Proceedings
Conference Proceedings
1. A Simple Method to Extract the Oxide Charge Density at the Buried Oxide/Substrate Interface in SOI Capacitor
Sonnenberg, V ; Martino, J
Pub. info.: Proceedings of the Ninth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.189-194,  1999.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-3
2.

Conference Proceedings
Conference Proceedings
2. Extraction of the interface and oxide charge density in SOI MOSFETs
Simoen, E ; Claeys, C ; Lukyanchikotva, N ; Petrichuk, M ; Garbar, N ; Martino, J A ; Sonnenberg, V
Pub. info.: Proceedings of the Seventh International Symposium on Silicon-on-Insulator Technology and Devices.  pp.309-317,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 96-3