Blank Cover Image

A new approach to prioritizing anomalies found during thermographic electrical inspections

Author(s):
Publication title:
Thermosense XXV, 22-24 April, 2003, Orlando, Florida, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5073
Pub. Year:
2003
Page(from):
222
Page(to):
230
Pages:
9
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819449320 [0819449326]
Language:
English
Call no.:
P63600/5073
Type:
Conference Proceedings

Similar Items:

J.R. Snell, Jr.

Society of Photo-optical Instrumentation Engineers

Shepard,S.M., Ahmed,T., Lhota,J.R., Rubadeux,B.A.

SPIE - The International Society for Optical Engineering

Snell,J.R.,Jr., Renowden,J.

SPIE - The International Society for Optical Engineering

McCullough, R.W.

SPIE - The International Society of Optical Engineering

Green,T.E., Snell,J.R.,Jr.

SPIE-The International Society for Optical Engineering

Belfit, Jr., R.W., Glass, J.A.

American Institute of Chemical Engineers

Spring, R.W., Snell, J.R.

SPIE-The International Society for Optical Engineering

10 Conference Proceedings Safety issues for infrared thermographers

Snell Jr.,J.R.

SPIE-The International Society for Optical Engineering

Snell,J.R.,Jr.

SPIE-The International Society for Optical Engineering

Shepard,S.M., Chaudhry,B.B., Predmesky,R.L., Zaluzec,M.J.

SPIE-The International Society for Optical Engineering

6 Conference Proceedings ASNT central certification program

Spring,R.W., Snell,J.R.,Jr.

SPIE-The International Society for Optical Engineering

Rubin, S., Bar, G., Cutts, R.W., Zawodzinski, T.A., Jr.

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12