1.

Conference Proceedings
Conference Proceedings
1. Application Of Room-Temperature Photoluminescence For Characterizing As-Grown And Thermally Processed CZ Silicon Wafers
Kirscht, F. ; Orschel, B. ; Kim, S. ; Rouvimov, S. ; Snegirev, B. ; Fletcher, M. ; Shabani, M. ; Buczkowski, A.
Pub. info.: Defect and impurity engineered semiconductors and devices III : symposium held April 1-5, 2002, San Francisco, California, U.S.A..  pp.173-178,  2002.  Warrendale, Pa.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 719
2.

Conference Proceedings
Conference Proceedings
2. Photoluminescence Intensity Analysis in Application To Contactless Characterization of Silicon Wafers*
Buczkowski, A. ; Orsehel, B. ; Kim, S. ; Rouvimov, S. ; Snegirev, B. ; Fletcher, M. ; Kirscht, F.
Pub. info.: High purity silicon VII : proceedings of the international symposium.  pp.299-310,  2002.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-20
3.

Conference Proceedings
Conference Proceedings
3. Lattice Strain and Defects in Epitaxial Silicon Wafers
Kirscht, F. ; Snegirev, B. ; Zaumseil, P. ; Kissinger, G. ; Takashima, K. ; Wildes, P. ; Hennessy, J.
Pub. info.: Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices.  pp.60-67,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-12