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13 results

Conference Proceedings

1. PHOTOREACTIONS IN POLYALKYLSILYNES INDUCED BY ArF-LASER IRRADIATION

Kuns, R.R. ; Bianconi, P.A. ; Horn, H.W. ; Smith, D.A. ; Freed, C.A.

Pub. info.:	Chemical perspectives of microelectronic materials II : symposium held November 26-28, 1990, Boston, Massachusetts, U.S.A.. pp.501-508, 1991. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	204

Conference Proceedings

2. ALTERNATIVE LENGTH’ SCALES FOR POLYCRYSTALLINE MATERIALS

Nichols, C.S. ; Cook, R.F. ; Clarke, D.R. ; Smith, D.A.

Pub. info.:	Defects in materials : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A.. pp.27-32, 1991. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	209

Conference Proceedings

3. CHARACTERISTICS OF SELECTIVE LPCVD W FILMS BY SILICON REDUCTION

Joshi, R.V. ; Smith, D.A.

Pub. info.:	Materials issues in silicon integrated circuit processing : symposium held April 15-18, 1986, Palo Alto, California, U.S.A.. pp.309-314, 1986. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	71

Conference Proceedings

4. MAJORITY CARRIER TRANSPORT ACROSS SEMICONDUCTOR GRAIN BOUNDARIES

Nelson, S.F. ; Evans, P.V. ; Sass, S.L. ; Smith, D.A.

Pub. info.:	Defects in materials : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A.. pp.415-420, 1991. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	209

Conference Proceedings

5. MICROSTRUCTURE OF NIOBIUM FILMS ORIENTED BY NON-NORMAL INCIDENCE ION BOMBARDMENT DURING GROWTH

Harper, J.M.E. ; Smith, D.A. ; Yu, L.S. ; Cuomo, J.J.

Pub. info.:	Beam-solid interactions and phase transformations : symposium held December 2-4, 1985, Boston, Massachusetts, USA. pp.343-348, 1985. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	51

Conference Proceedings

6. MICROSTRUCTURE AND RESISTIVITY OF Cr75Si25 THIN FILMS

Weiss, B.Z. ; Tu, K.N. ; Smith, D.A.

Pub. info.:	Materials issues in silicon integrated circuit processing : symposium held April 15-18, 1986, Palo Alto, California, U.S.A.. pp.333-338, 1986. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	71

Conference Proceedings

7. Structure of twin boundaries in silicon

Fontaine, C. ; Smith, D.A.

Pub. info.:	Grain boundaries in semiconductors : proceedings of the Materials Research Society annual meeting, November 1981, Boston Park Plaza Hotel, Boston, Massachusetts, U.S.A.. pp.39-43, 1982. New York. North-Holland
Title of ser.:	Materials Research Society symposia proceedings
Ser. no.:	5

Conference Proceedings

8. COMPUTED STRUCTURES OD [001] SYMMETRICAL TILT BOUNDERIES

Wetzel, J.T. ; Levi, A.A. ; Smith, D.A.

Pub. info.:	Computer-based microscopic description of the structure and properties of materials : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A.. pp.157-162, 1986. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	63

Conference Proceedings

9. SCANNING TUNNELING MICROSCOPE STUDY ON AMORPHOUS AND CRYSTALLIZED CoSi2 FILMS

Kuwabara, M. ; Smith, D.A. ; Welland, M.E.

Pub. info.:	Evolution of thin-film and surface microstructure : symposium held November 26-December 1, 1990, Boston, Massachusetts, U.S.A.. pp.615-620, 1991. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	202

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Conference Proceedings

10. Defect structure of the epitaxial Pd2Si-silicon interface

Cherns, D. ; Smith, D.A.

Pub. info.:	Defects in semiconductors : proceedings of the Materials Research Society Annual Meeting, November 1980, Copley Plaza Hotel, Boston, Massachusetts, U.S.A.. pp.291-296, 1981. New York. North Holland
Title of ser.:	Materials Research Society symposia proceedings
Ser. no.:	2

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