1.

Conference Proceedings
Conference Proceedings
1. Transmission Electron Diffraction Techniques for NM Scale Strain Measurement in Semiconductors
Vanhellemont, J. ; Janssens, K. G. F. ; Frabboni, S. ; Smeys, P. ; Balboni, R. ; Armigliato, A.
Pub. info.: Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A..  pp.479-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 406
2.

Conference Proceedings
Conference Proceedings
2. High Performance CMOS on SOI
Yang, I.Y. ; Fung, S. ; Sleight, J. ; Narasimha, S. ; Zamdmer, N. ; Smeys, P. ; Welser, J. ; Agnello, P. ; Leobandung, E. ; Shahidi, G.
Pub. info.: Semiconductor wafer bonding : science, technology, and applications : proceedings of the international symposia.  pp.177-196,  2001.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-27
3.

Conference Proceedings
Conference Proceedings
3. Transmission Electron Diffraction Techniques for NM Scale Strain Measurement in Semiconductors
Vanhellemont, J. ; Janssens, K. G. F. ; Frabboni, S. ; Smeys, P. ; Balboni, R. ; Armigliato, A.
Pub. info.: Surface/interface and stress effects in electronic material nanostructures : symposium held November 27-December 1, 1995, Boston, Massachusetts, U.S.A..  pp.435-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 405