Infrared technology and applications XXIX : 21-25 April 2003, Orlando, Florida, USA. pp.911-917, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Materials for infrared detectors II : 8-9 July 2002 ,Seattle, Washington, USA. pp.136-145, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
17th international conference on photoelectronics and night vision devices : 27-31 May 2002, Moscow, Russia. pp.98-104, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Semiconductor photodetectors II : 25-26 January 2005, San Jose, California, USA. pp.140-145, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Semiconductor photodetectors II : 25-26 January 2005, San Jose, California, USA. pp.132-139, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Detectors and associated signal processing : 1-2 October 2003, St. Etienne, France. pp.16-25, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering