1.

Conference Proceedings

Conference Proceedings
Singh, V.K. ; Garcia-Colevatti, J.
Pub. info.: Design, process integration, and characterization for microelectronics : 6-7 March 2002, Santa Clara, USA.  pp.405-410,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4692
2.

Conference Proceedings

Conference Proceedings
Prasad, Ganga ; Gandotra, V.K. ; Padmavati, M.V.G. ; Raina, Alka ; Singh, V.K. ; Sharma, R.K. ; Sharma, B.B. ; Kumar, Sunil Jai ; Reddy, M.R.P.
Pub. info.: Proceedings of the Eleventh International Workshop on the Physics of Semiconductor Devices : (December 11-15, 2001).  VOL-2  pp.1155-1158,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4746
3.

Technical Paper

Technical Paper
Singh, V.K. ; Wani, N. ; Rastogi, N.
Pub. info.: 2005 SAE Noise and Vibration Conference and Exhibition : technical paper.  2005.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2005
4.

Technical Paper

Technical Paper
Wani, N.Y. ; Singh, V.K. ; Falbo, G. ; Monkaba, V.D.
Pub. info.: 2004 SAE world congress : technical paper.  2004.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2004
5.

Conference Proceedings

Conference Proceedings
Borodovsky, Y.A. ; Schenker, R.E. ; Allen, G.A. ; Tejnil, E. ; Hwang, D.H. ; Lo, F.-C. ; Singh, V.K. ; Gleason, R.E. ; Brandenburg, J.E. ; Bigwood, R.M.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology IX.  pp.1-14,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4754
6.

Conference Proceedings

Conference Proceedings
Fryer, D.S. ; Singh, V.K. ; Phung, T.N. ; Liu, P.
Pub. info.: Advances in Resist Technology and Processing XXI.  pp.379-383,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5376