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35 results

Conference Proceedings

1. Application of In Situ HREM to Study Crystallization in Materials

Sinclair, R. ; Min, K. H. ; Kwon, U.

Pub. info.:	Current research in advanced materials and processes : YUCOMAT VI : proceedings of the 6th Conference of the Yugoslav Materials Research Society, held in Herceg-Novi, Serbia and Montenegro, September 13-17, 2004. pp.7-12, 2005. Zuerich-Uetikon, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	494

Conference Proceedings

2. Roughness Measurements of Thin Si02 and Poly-Si Interfaces using High Resolution Cross-sec-tional TEM

Yamaguchi, M. ; Sinclair, R. ; Niwa, M.

Pub. info.:	Proceedings of the Symposium on Silicon Nitride and Silicon Dioxide Thin Insulating Films. pp.232-239, 1997. Pennington, New Jersey. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	97-10

Conference Proceedings

3. Transmission electron microscopy studies of the polycrystalline silison-SiO2 interface

Bravman, J. C. ; Sinclair, R.

Pub. info.:	Interfaces and contacts : symposium held November 1982 in Boston, Massachusetts, U.S.A.. pp.153-162, 1983. New York. North-Holland
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	18

Conference Proceedings

4. The morphology of the polysilicon-Si02 interface

Bravaman, J. C. ; Sinclair, R.

Pub. info.:	Thin films and interfaces II : symposium held November 1983, in Boston, Massachusetts, U.S.A.. pp.311-316, 1984. New York. North-Holland
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	25

Conference Proceedings

5. A PHASE DIAGRAM APPROACH FOR PREDICTING REACTIONS IN Al/TiW(-NITRIDE) THIN-FILM SYSTEMS

Bhansali, A. S. ; Raaijmakers, I. J. M. M. ; Sinclair, R. ; Morgan, A. E. ; Burrow, B. J. ; Arst, M.

Pub. info.:	Thin film structures and phase stability : symposium held April 16-17, 1990, San Francisco, California, U.S.A.. pp.15-20, 1990. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	187

Conference Proceedings

6. POLYSILANES AS POSIBLE PRECURSORS TO SILICON CARBIDE

West, R. ; Sinclair, R.

Pub. info.:	Better ceramics through chemistry : symposium held February 1984 in Albuquerque, New Mexico, U.S.A.. pp.387-390, 1984. New York. North-Holland
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	32

Conference Proceedings

7. STRUCTURE OF THE Ti-SINGLE CRYSTAL Si INTERFACE

Ogawa, S. ; Kouzaki, T. ; Yoshida, T. ; Sinclair, R.

Pub. info.:	Advanced metallizations in microelectronics : symposium held April 16-20, 1990, San Francisco, California, U.S.A.. pp.139-144, 1990. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	181

Conference Proceedings

8. THE PHASE FORMATION SEQUENCE IN TITANIUM-SILICON THIN FILMS

Beyers, R. ; Sinclair, R.

Pub. info.:	Thin films : interfaces and phenomena : symposium held December 2-6, 1985, Boston, Massachusetts, USA. pp.43-44, 1985. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	54

Conference Proceedings

9. CRYSTALLINE-TO-AMORPHOUS TRANSITIONS IN Ti-Ni ALLOYS

Pelton, A.R. ; Moine, P. ; Noack, M.A. ; Sinclair, R.

Pub. info.:	Materials problem solving with the transmission electron microscope : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A.. pp.291-302, 1986. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	62

10.

Conference Proceedings

10. IN-SITU HIGH RESOLUTION TRANMISSION ELECTRON MICROSCOPY OF DYNAMIC EVENTS DURING THE AMORPHOUS TO CRYSTALLINE PHASE TRANSFORMATION IN SILICON

Parker, M.A. ; Sigmon, T.W. ; Sinclair, R.

Pub. info.:	Materials problem solving with the transmission electron microscope : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A.. pp.311-322, 1986. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	62

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