1.

Conference Proceedings
Conference Proceedings
1. Are the Models of the Triply Charged Gallium Vacancy and Doubly Charged Gallium Interstitial Alive or Dead?
Cohen, R. M. ; Chen, C. Y. ; Li, W. M. ; Simons, D. S. ; Chi, P. H.
Pub. info.: Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.959-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 378
2.

Conference Proceedings
Conference Proceedings
2. Effect of Fermi Level Pinning at the Surface During OMVPE Growth
Cohen, R. M. ; Chen, C. Y. ; Li, W. M. ; Simons, D. S. ; Chi, P. H.
Pub. info.: Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.875-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 378
3.

Conference Proceedings
Conference Proceedings
3. The Formation of Abrupt N+ Doping Profiles Using Atomic Hydrogen and Sb During Si MBE
Thompson, P. E. ; Silvestre, C. ; Twigg, M. ; Jernigan, G. ; Simons, D. S.
Pub. info.: Epitaxy and applications of si-based heterostructures : symposium held April 13-17, 1998, San Francisco, California, U.S.A..  pp.367-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 533
4.

Conference Proceedings
Conference Proceedings
4. On Compensation and Impurities in State-of-the-Art GaN Epilayers Grown on Sapphire
Wickenden, A. E. ; Gaskill, D. K. ; Koleske, D. D. ; Doverspike, K. ; Simons, D. S. ; Chi, P. H.
Pub. info.: Gallium nitride and related materials : the First International Symposium on Gallium Nitride and Related Materials held November 27-December 1, 1995, Boston, Massachusetts, U.S.A..  pp.679-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 395
5.

Conference Proceedings
Conference Proceedings
5. Near-surface and interfacial profiling by neutron depth profiling (NDP) and secondary ion mass spectrometry (SIMS)
Downing, R. G. ; Fleming, R. F. ; Maki, J. T. ; Simons, D. S. ; Stallard, B. R.
Pub. info.: Thin films and interfaces II : symposium held November 1983, in Boston, Massachusetts, U.S.A..  pp.655-656,  1984.  New York.  North-Holland
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 25