1.

Conference Proceedings
Conference Proceedings
1. Advances in microchannel plate detectors for UV/visible astronomy
Siegmund, O.H.W.
Pub. info.: Future EUV/UV and visible space astrophysics missions and instrumentation : 22-23 August 2002, Waikoloa, Hawaii, USA.  pp.181-190,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4854
2.

Conference Proceedings
Conference Proceedings
2. The latest developments of high-gain Si microchannel plates
Tremsim, A.S. ; Vallerga, J.V. ; Siegmund, O.H.W. ; Beetz, C.P. ; Boerstler, R.W.
Pub. info.: Future EUV/UV and visible space astrophysics missions and instrumentation : 22-23 August 2002, Waikoloa, Hawaii, USA.  pp.215-224,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4854
3.

Conference Proceedings
Conference Proceedings
3. Futher scrubbing and quantum efficiency results of the HST-COS far-ultraviolet detector
Martin, A.P. ; Vallerga, J.V. ; McPhate, J.B. ; Siegmund, O.H.W.
Pub. info.: Future EUV/UV and visible space astrophysics missions and instrumentation : 22-23 August 2002, Waikoloa, Hawaii, USA.  pp.526-531,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4854
4.

Conference Proceedings
Conference Proceedings
4. Advances in wide-bandgap-semiconductor-based photocathode devices for low-light-level applications
Ulmer, M.P. ; Wessels. B.W. ; Siegmund, O.H.W.
Pub. info.: Future EUV/UV and visible space astrophysics missions and instrumentation : 22-23 August 2002, Waikoloa, Hawaii, USA.  pp.225-232,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4854
5.

Conference Proceedings
Conference Proceedings
5. The Galaxy Evolution Explorer
Martin, C. ; Barlow, T. ; Barnhart, W. ; Bianchi, L. ; Blakkolb, B.K. ; Bruno, D. ; Baushman, J. ; Byun, Y.-I. ; Chiville, M. ; Conrow, T. ; Cooke, B. ; Donas, J. ; Fanson, J.L. ; Forster, K. ; Friedman, P.G. ; Grange, R. ; Griffiths, D. ; Heckman, T. ; Jee, J. ; Jelinsky, P.N. ; Kim, S. ; Lee, S.-C. ; Lee, Y.-W. ; Liu, D. ; Madore, B.F. ; Malina, R. ; Mazer, A. ; McLean, R. ; Milliard, B. ; Mitchell, W. ; Morais, M. ; Morrissey, P.F. ; Neff, S.G. ; Raison, F. ; Randall, D. ; Rich, M. ; Schiminovich, D. ; Schmitigal, W. ; Sen, A. ; Siegmund, O.H.W. ; Small, T. ; Stock, J.M ; Surber, F. ; Szalay, A. ; Vaughan, A.H. ; Weigand, T. ; Welsh, B.Y. ; Wu, P. ; Wyder, T. ; Xu, C.K. ; Zsoldas, J.
Pub. info.: Future EUV/UV and visible space astrophysics missions and instrumentation : 22-23 August 2002, Waikoloa, Hawaii, USA.  pp.336-350,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4854
6.

Conference Proceedings
Conference Proceedings
6. A compact high-throughput imaging EUV/FUV spectrometer
Wilkinson, E. ; Schneider, N.M. ; Steg, S.R. ; Westfall, J.C. ; Lamprecht, B.P. ; Andrews, J.P. ; Siegmund, O.H.W. ; Beasley, M.N.
Pub. info.: Future EUV/UV and visible space astrophysics missions and instrumentation : 22-23 August 2002, Waikoloa, Hawaii, USA.  pp.479-487,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4854
7.

Conference Proceedings
Conference Proceedings
7. Status of the Cosmic Hot Intgerstellar Plasma Spectrometer(CHIPS) university-class explorer mission
Hurwitz, M. ; Davis, R. ; Dawson, S. ; Dobson, P. ; Donakowski, W. ; Friedman, A. ; Gaines, G.A. ; Edelstein, J. ; Hemphill, R. ; Hoberman, J. ; Janicik, J. ; Jelinsky, P.N. ; Lampton, M.L. ; Marchant, W. ; Marckwordt, M. ; Mirczak, J. ; Sasseen, T.P. ; Sholl, M. ; Siegmund, O.H.W. ; Sirk, M.M. ; Stone, D. ; Sulack, S. ; Riddle Taylor, E. ; Veno, M. ; Wolff, J.
Pub. info.: Future EUV/UV and visible space astrophysics missions and instrumentation : 22-23 August 2002, Waikoloa, Hawaii, USA.  pp.319-328,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4854
8.

Conference Proceedings
Conference Proceedings
8. Performance results of the GALEX cross delay line detectors
Jelinsky, P.N. ; Morrissey, P.F. ; Malloy, J.M. ; Jelinsky, S.R. ; Siegmund, O.H.W. ; Martin, C. ; Schiminovich, D. ; Forster, K. ; Wyder, T. ; Friedman, P.G.
Pub. info.: Future EUV/UV and visible space astrophysics missions and instrumentation : 22-23 August 2002, Waikoloa, Hawaii, USA.  pp.233-240,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4854
9.

Conference Proceedings
Conference Proceedings
9. Advances in wide-bandgap semicondutor-based photocathode devices for-light-level applications (Invited Paper)
Ulmer, M.P. ; Wessels, B.W. ; Siegmund, O.H.W.
Pub. info.: Photodetector materials and devices VII : 21-23 January 2002, San Jose, USA.  pp.94-103,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4650
10.

Conference Proceedings
Conference Proceedings
10. X-ray imaging of micro-objects using dark field refraction-contrast method with resonantly absorbing multilayer mirrors
Protopopov, V.V. ; Sobota, J. ; Tremsin, A.S. ; Siegmund, O.H.W. ; Platonov, Y.Ya.
Pub. info.: Medical Imaging 2002 : Physics of Medical Imaging : 24-26 February 2002, San Diego, California, USA.  pp.277-285,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4682