1.

Conference Proceedings
Conference Proceedings
1. Analysis of Ordered Structure of Buried Oxide Layers in SIMOX Wafers
Shimura, T ; Ejiri, R ; Hosoi, T ; Umeno, M
Pub. info.: Proceedings of the Ninth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.155-160,  1999.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-3
2.

Conference Proceedings
Conference Proceedings
2. Shift selectivity of the collinear holographic storage system [6282-51 ]
Shimura, T ; Ichimura, S. ; Ashizuka, Y. ; Fujimura, R.
Pub. info.: Optical Data Storage 2006 : 23-26 April 2006, Montreal, Canada.  pp.62820S-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6282