1.

Conference Proceedings
Conference Proceedings
1. Hetero-Epitaxial Growth of 3C-SiC on Silicon Substrates by Plasma Assisted CVD
Shimizu, H. ; Aoyama, Y.
Pub. info.: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.299-302,  2006.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 527-529
2.

Conference Proceedings
Conference Proceedings
2. Effects of Surface Defects (COPs) on Isolation Leakage and Gate Oxide Integrity in MOS Large-Scale-Integrated-Circuit Devices and Cost-Effective p-lp- Epitaxial Silicon
Shimizu, H. ; Satoh, T. ; Muranaka, M. ; Makabe, K. ; Miura, M.
Pub. info.: Proceedings of the Third International Symposium on Defects in Silicon.  pp.315-323,  1999.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-1
3.

Conference Proceedings
Conference Proceedings
3. DEVELOPMENTS OF TAPE AND WIRE FABRICATION PROCESSES FOR HIGH TCBa2YCu3O7-y OXIDE SUPERCONDUCTORS
Tagano, K. ; Kumakura, H. ; Shimizu, H.
Pub. info.: High-temperature superconductors : symposium held November 30-December 4, 1987, Boston, Massachusetts, U.S.A..  pp.191-196,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 99
4.

Conference Proceedings
Conference Proceedings
4. AC PHOTOVOLTAIC INSPECTION OF P-N JUNCTIONS HAVING HIGH LEAKAGE CURRENT
Honma, N. ; Shimizu, H. ; Munakata, C. ; Ogasawara, M.
Pub. info.: Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.951-954,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 163
5.

Conference Proceedings
Conference Proceedings
5. Variation-Interval Prediction of Median-Path Loss in Multipath Environments Using Measured Delay Profiles
Takahashi, S. ; Shimizu, H. ; Ishii, M. ; Masui, H. ; Kobayashi, T.
Pub. info.: AP 2000 : millennium Conference on Antennas & Propagation, Davos, Switzerland, 9-14 April 2000.  2000.  Noordwijk, Netherlands.  ESA Publications Division
Title of ser.: ESA SP
Ser. no.: 444
6.

Conference Proceedings
Conference Proceedings
6. Effect of Aluminum on Oxide Growth and Oxide Charges in Silicon Wafers
Shimizu, H. ; Ikeda, M. ; Munakata, C. ; Nagashima, N.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.296-304,  2000.  Bellingham, Wash..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-17
7.

Conference Proceedings
Conference Proceedings
7. Determination of the Aluminum-Induced Oxide Charge by AC Surface Photovoltage Measurements in N-Type Silicon
Shimizu, H. ; Ikeda, M. ; Shin, R.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah.  pp.31-36,  2003.  Pennington, NJ.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5133
8.

Conference Proceedings
Conference Proceedings
8. Equation of state for fluid and solid hydrogen-isotopes H2, D2, and T2
Shimizu, H.
Pub. info.: Fluids, engineering, and safety.  pp.57-60,  1984.  New York.  North-Holland
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 22(2)
9.

Conference Proceedings
Conference Proceedings
9. Far- and Mid-Infrared Absorption Study of HfO2/SiO2/Si System
Toriumi, A. ; Tomida, K. ; Shimizu, H. ; Kita, K. ; Kyuno, K.
Pub. info.: Silicon nitride, silicon dioxide thin insulating films, and other emerging dieletrics VIII : proceedings of the international symposium.  pp.471-481,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-01
10.

Conference Proceedings
Conference Proceedings
10. An AC Surface Photovoltage Diagnostic Technique for Nondestructive Detection of Metallic Contaminants in Silicon Wafers
Shimizu, H. ; Munukata, C.
Pub. info.: Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices.  pp.120-130,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-33