Microwave remote sensing of the atmosphere and environment II : 9-12 October 2000, Sendai, Japan. pp.319-326, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Electro-optic, integrated optic, and electronic technologies for online chemical process monitoring : 2-5 November 1998, Boston, Massachusetts. pp.261-267, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Electronic imaging and multimedia systems II : 18-19 September, 1998, Beijing, China. pp.306-310, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Organic photonic materials and devices II : 24-26 January 2000, San Jose, USA. pp.158-163, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Hyperspectral remote sensing and application : 15-17 September 1998, Beijing, China. pp.243-251, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Fiber optic sensors V : 6-7 November 1996, Beijing, China. pp.559-564, 1996. Bellingham, Wash. USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings. pp.132-134, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Computer-aided design and computer graphics : Fourth International Conference on Computer-Aided Design and Computer Graphics : 23-25 October, 1995, Wuhan, China. pp.712-717, 1996. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Document recognition IV : 12-13 February, 1997, San Jose, California. pp.2-9, 1997. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China. pp.171-174, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering