Micromachining and microfabrication process technology VI : 18-20 September 2000, Santa Clara, USA. pp.451-461, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Multispectral and hyperspectral image acquisition and processing : 22-24 2001, Wuhan, China. pp.335-338, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Multispectral and hyperspectral image acquisition and processing : 22-24 2001, Wuhan, China. pp.284-288, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Multispectral and hyperspectral image acquisition and processing : 22-24 2001, Wuhan, China. pp.289-292, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Device and process technologies for MEMS and microelectronics : 27-29 October 1999, Royal Pines Resort, Queensland, Australia. pp.340-345, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.223-227, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China. pp.61-64, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Automated optical inspection for industry : 6-7 November 1996, Beijing, China. pp.304-310, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Detectors, focal plane arrays, and applications : 4-5 November 1996, Beijing, China. pp.111-114, 1996. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering