Object detection, classification, and tracking technologies : 22-24 October 2001, Wuhan, China. pp.141-146, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Object detection, classification, and tracking technologies : 22-24 October 2001, Wuhan, China. pp.36-40, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Optical engineering for sensing and nanotechnology (ICOSN 2001) : 6-8 June 2001, Yokohama, Japan. pp.31-34, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Light-emitting diodes : research, manufacturing, and applications III : 27-28 January 1999, San Jose, California. pp.86-92, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Design, fabrication, and characterization of photonic devices : 30 November-3 December 1999, Singapore. pp.570-575, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.58-66, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Polymer photonic devices : 28-30 January 1998 San Jose, California. pp.248-256, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Organic photonic materials and devices II : 24-26 January 2000, San Jose, USA. pp.158-163, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Interferometry in optical astronomy : 27 - 29 March 2000 Munich, Germany. Part2 pp.815-827, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Organic photonic materials and devices II : 24-26 January 2000, San Jose, USA. pp.181-188, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering