1.

Conference Proceedings
Conference Proceedings
1. GaAs/AlGaAs p-type multiple quantum wells for infrared detection at normal incidence: model and experiment
Szmulowicz,F. ; Brown,G.J. ; Liu,H.C. ; Shen,A. ; Wasilewski,Z.R. ; Buchanan,M.
Pub. info.: International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland.  pp.293-306,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4413
2.

Conference Proceedings
Conference Proceedings
2. QWIPs beyond FPAs: high-speed room-temperature detectors
Liu,H.C. ; Dudek,R. ; Shen,A. ; Dupont,E. ; Song,C.Y. ; Wasilewski,Z.R. ; Buchanan,M.
Pub. info.: Infrared technology and applications XXVII : 16-20 April 2001, Orlando, USA.  pp.489-497,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4369
3.

Conference Proceedings
Conference Proceedings
3. Quantum well infrared detection devices
Liu,H.C. ; Song,C.Y. ; Shen,A. ; Dudek,R. ; Gao,M. ; Dupont,E. ; Wasilewski,Z.R. ; Buchanan,M. ; Wilson,P.H. ; Robinson,B.J. ; Thompson,D.A. ; Brown,G.J. ; Szmulowicz,F. ; Ehret,J.E.
Pub. info.: Photodetectors : materials and devices VI : 22-24 January 2001, San Jose, USA.  pp.130-140,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4288
4.

Conference Proceedings
Conference Proceedings
4. Heterojunction interfacial workfunction detectors for far-infrared applications
Perera,A.G.U. ; Matsik,S.G. ; Letov,V.Y. ; Liu,H.C. ; Shen,A. ; Gao,M. ; Wasilewski,Z.R. ; Buchanan,M. ; Rolfe,S.J.
Pub. info.: Photodetectors : materials and devices VI : 22-24 January 2001, San Jose, USA.  pp.371-378,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4288