1.

Conference Proceedings
Conference Proceedings
1. Anisotropic Properties of GaN Studied by Raman Scattering
Lin, H.C. ; Feng, Z.C. ; Chen, M.S. ; Shen, Z.X. ; Lu, W. ; Collins, W.E.
Pub. info.: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.1517-1520,  2006.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 527-529
2.

Conference Proceedings
Conference Proceedings
2. Plasmon-induced heating effect in surface enhanced Raman scattering [6095-09]
Kho, K.W. ; Shen, Z.X. ; Lei, Z. ; Watt, F. ; Soo, K.C. ; Olivo, M.
Pub. info.: Nanobiophotonics and biomedical applications III : 23-24 January 2006, San Jose, California, USA.  pp.609508-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6095
3.

Conference Proceedings
Conference Proceedings
3. Raman and photoluminescence investigation of ZnxCd1-xSe thin film under high pressure
Li, W.S. ; Shen, Z.X. ; Shen, D.Z. ; Fan, X.W.
Pub. info.: Inorganic optical materials : 19-20 July, 1998, San Diego, California.  pp.126-130,  1998.  Bellingham, Washington.  SPIE
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3424
4.

Conference Proceedings
Conference Proceedings
4. Thickness Effect On Nickel Silicide Formation And Thermal Stability For Ultra Shallow Junction CMOS
Zhao, F.F. ; Shen, Z.X. ; Zheng, J.Z. ; Gao, W.Z. ; Osipowicz, T. ; Pang, C.H. ; Lee, P.S. ; See, A.K.
Pub. info.: Silicon materials - processing characterization and reliability : symposium held April 1-5, 2002, San Francisco, California, U.S.A..  pp.41-46,  2002.  Warrendale.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 716
5.

Conference Proceedings
Conference Proceedings
5. Direct Formation of C54 Phase on the Basis of C40 TiSi2 and Its Applications in Deep Sub-Micron Technology
Chen, S.Y. ; Shen, Z.X. ; Xu, S.Y. ; See, A.K. ; Chan, L.H. ; Li, W.S.
Pub. info.: Gate stack and silicide issues in silicon processing II : symposium held April 17-19, 2001, San Francisco, California, U.S.A..  2002.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 670
6.

Conference Proceedings
Conference Proceedings
6. Surface enhanced Raman spectroscopic (SERS) study of saliva in the early detection of oral cancer
Kho, K.W. ; Malini, O. ; Shen, Z.X. ; Soo, K.C.
Pub. info.: Optical Diagnostics and Sensing V.  pp.84-91,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5702