1.

Conference Proceedings
Conference Proceedings
1. Characterization of fretting fatigue damage using nondestructive approaches
Matikas,T.E. ; Shell,E.B. ; Nicolaou,P.D.
Pub. info.: Nondestructive evaluation of aging Materials and Composites III : 3-5 March 1999, Newport Beach, California.  pp.2-10,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3585
2.

Conference Proceedings
Conference Proceedings
2. Development of methods to observe fatigue damage through surface characteristics
Schroeder,J.L. ; Shell,E.B. ; Matikas,T.E. ; Eylon,D.
Pub. info.: Nondestructive evaluation of aging Materials and Composites III : 3-5 March 1999, Newport Beach, California.  pp.117-124,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3585
3.

Conference Proceedings
Conference Proceedings
3. Wavelet analysis of fretting experimental data
Frantziskonis,G.N. ; Shell,E.B. ; Woo,J. ; Matikas,T.E. ; Nicolaou,P.D.
Pub. info.: Nondestructive evaluation of aging Materials and Composites III : 3-5 March 1999, Newport Beach, California.  pp.11-27,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3585
4.

Conference Proceedings
Conference Proceedings
4. Modeling fretting fatigue:interface contact conditions based on profilometry data
Nicolaou,P.D. ; Matikas,T.E. ; Shell,E.B.
Pub. info.: Nondestructive evaluation of aging Materials and Composites III : 3-5 March 1999, Newport Beach, California.  pp.28-39,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3585
5.

Conference Proceedings
Conference Proceedings
5. Applicability of white light scanning interferometry for high-resolution characterization of surface defects
Kramb,V. ; Shell,E.B. ; Hoying,J. ; Simon,L.B. ; Meyendorf,N.
Pub. info.: Nondestructive Evaluation of Materials and Composites V.  pp.135-145,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4336