1.

Conference Proceedings

Conference Proceedings
Sharma, R. ; Ramakrishna, B. L. ; Iqbal, Z. ; Thadhani, N. N. ; Chawla, N.
Pub. info.: High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, USA.  pp.381-386,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 183
2.

Conference Proceedings

Conference Proceedings
Ngai, T. ; Sharma, R. ; Fretwell, J. ; Chen, X. ; Chen, J. ; Brookover, W. ; Banerjee, S.
Pub. info.: Silicon Nitride and Silicon Dioxide Thin Insulating Films : proceedings of the sixth International Symposium.  pp.95-108,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-7
3.

Conference Proceedings

Conference Proceedings
Desai, N. ; Sharma, R. ; Kumar, S. ; Misra, T. ; Gujraty, V. ; Rana, S.
Pub. info.: Disaster forewarning diagnostic methods and management : 13-14 and 16 November 2006, Goa, India.  pp.64120G-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6412
4.

Conference Proceedings

Conference Proceedings
Melpolder, S. M. ; West, A. W. ; Cunningham M. P. ; Sharma, R.
Pub. info.: Better ceramics through chemistry IV : symposium held April 16-20, 1990, San Francisco, California, U.S.A..  pp.387-392,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 180
5.

Conference Proceedings

Conference Proceedings
Smith, David J. ; Lu, Ping ; McCartney, M.R. ; Sharma, R.
Pub. info.: Surface chemistry and beam-solid interactions : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A..  pp.599-606,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 201
6.

Conference Proceedings

Conference Proceedings
Schmitz, K.M. ; Jiao, K.L. ; Sharma, R. ; Anderson, W.A. ; Rajeswaran, G. ; Zheng, L.R. ; Cole, M.W. ; Lareau, R.T.
Pub. info.: Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.993-996,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 163
7.

Conference Proceedings

Conference Proceedings
Sharma, R. ; Agarwal, N. ; Sarkar, A.
Pub. info.: Remote sensing and modeling of the atmosphere, oceans, andinteractions : 13-16 November 2006, Goa, India.  pp.64040R-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6404
8.

Conference Proceedings

Conference Proceedings
Agarwal, N. ; Sharma, R. ; Basu, S. ; Agarwal, V. K.
Pub. info.: Remote sensing and modeling of the atmosphere, oceans, andinteractions : 13-16 November 2006, Goa, India.  pp.64040Z-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6404
9.

Conference Proceedings

Conference Proceedings
Agarwal, N. ; Sharma, R. ; Agarwal, V. K.
Pub. info.: Remote sensing and modeling of the atmosphere, oceans, andinteractions : 13-16 November 2006, Goa, India.  pp.64040W-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6404
10.

Conference Proceedings

Conference Proceedings
Agarwal, V. K. ; Sharma, R. ; Agarwal. N.
Pub. info.: Remote sensing and modeling of the atmosphere, oceans, andinteractions : 13-16 November 2006, Goa, India.  pp.64040S-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6404