1.

Conference Proceedings
Conference Proceedings
1. Locking of Dislocations by Oxygen in Cz-Silicon
Senkader, S. ; Jurkschat, K. ; Wilshaw, P. ; Falster, R.
Pub. info.: Proceedings of the Third International Symposium on Defects in Silicon.  pp.280-289,  1999.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-1
2.

Conference Proceedings
Conference Proceedings
2. A model for the phase-change process in GeSbTe thin films used for optical and electrical data storage
Senkader, S. ; Aziz, M.M. ; Wright, C.D.
Pub. info.: Optical data storage 2003 : 11-14 May 2003, Vancouver, British Columbia, Canada.  pp.98-104,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5069
3.

Conference Proceedings
Conference Proceedings
3. Understanding the electrothermal processes involved in probe storage on phase-change media
Armand, M. ; Wright, C.D. ; Aziz, M.M. ; Senkader, S.
Pub. info.: Optical data storage 2003 : 11-14 May 2003, Vancouver, British Columbia, Canada.  pp.150-157,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5069
4.

Conference Proceedings
Conference Proceedings
4. Impurity Locking of Dislocations in Silicon （Invited Paper）
Giannattasio, A. ; Murphy, ID. ; Senkader, S. ; Falster, R.J. ; Wilshaw, P.R.
Pub. info.: High purity silicon VIII : proceedings of the international symposium.  pp.39-54,  2004.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-05
5.

Conference Proceedings
Conference Proceedings
5. Understanding the Electro-Thermal and Phase-Transformation Processes in Phase-Change Materials for Data Storage Applications
Wright, C.D. ; Armand, M. ; Aziz, M.M. ; Senkader, S. ; Yu, W.
Pub. info.: Advanced data storage materials and characterization techniques : symposium held December 1-4, 2003, Boston, Massachusetts, U.S.A..  pp.61-72,  2004.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 803
6.

Conference Proceedings
Conference Proceedings
6. COMPUTER SIMULATION OF THE INFLUENCE OF POINT AND EXTENDED DEFECTS ON THE PRECIPITATION OF OXYGEN DURING RAPID THERMAL PROCESSING
Esfandyari, J. ; Senkader, S. ; Hobler, G. ; Poetzl, H. ; Murphy, B.
Pub. info.: Proceedings of the Seventh International Symposium on Silicon Materials Science and Technology.  pp.896-907,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-10
7.

Conference Proceedings
Conference Proceedings
7. On the Nature of Grown-In Defects in Silicon: Dependence on Pulling Conditions and Evolution During Thermal Treatments
Vanhellemont, J. ; Kissinger, G. ; Senkader, S. ; Graef, D. ; Kenis, K. ; Depas, M. ; Lambert, U. ; Wagner, P.
Pub. info.: Proceedings of the Fourth International Symposium on High Purity Silicon.  pp.226-237,  1996.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 96-13