1.

Conference Proceedings
Conference Proceedings
1. *THE KINETICS AND MICROSTRUCTURE OF ION BEAM INDUCED CRYSTALLIZATION OF SILICON
Williams, J. S. ; Brown, W. L. ; Elliman, R. G. ; Knoell, R. V. ; Maher, D. M. ; Seidel, T. E.
Pub. info.: Ion beam processes in advanced electronic materials and device technology : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.79-90,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 45
2.

Conference Proceedings
Conference Proceedings
2. Integration of PECVD Tungsten Nitride as a Barrier Layer for Copper Metallization
Ivanova, A. R. ; Galewski, C. J. ; Sans, C. A. ; Seidel, T. E. ; Grunow, S. ; Kumar, K. ; Kaloyeros, A. E.
Pub. info.: Advanced interconnects and contacts : symposium held April 5-7, 1999, San Francisco, California, U.S.A..  pp.321-,  1999.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 564
3.

Conference Proceedings
Conference Proceedings
3. BEAM INDUCED CRYSTALLIZATION OF SILICON
Williams, J. S. ; Elliman, R. G. ; Brown, W. L. ; Seidel, T. E.
Pub. info.: Layered structures, epitaxy, and interfaces : symposium held November 26-30, 1984, Boston, Massachusetts, U.S.A..  pp.127-134,  1985.  Pittsburgh.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 37