1.

Conference Proceedings
Conference Proceedings
1. Effect of Gate Profile on the Characteristics of 0.5μm GaAs MESFETs
Naik, A.A. ; Rawal, D.S. ; Prabhakar, S. ; Sai Saravanan, G. ; Sehgal, B.K. ; Gulati, R. ; Vyas, H.P. ; Kumar, Rajesh ; Suryanarayana, P. ; Rao, A.V.S.K. ; Govindacharyulu, P.A.
Pub. info.: Proceedings of the Eleventh International Workshop on the Physics of Semiconductor Devices : (December 11-15, 2001).  VOL-2  pp.1148-1151,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4746
2.

Conference Proceedings
Conference Proceedings
2. Broad Band Modelling of NiCr Resistors
Sharma, Renu ; Vinayak, Seema ; Kumar, Ashok ; Sehgal, B.K. ; Ray, U.C.
Pub. info.: Proceedings of the Eleventh International Workshop on the Physics of Semiconductor Devices : (December 11-15, 2001).  VOL-2  pp.922-925,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4746
3.

Conference Proceedings
Conference Proceedings
3. Effect of Various Alloying Cycles on AuGe/Ni/Au Ohmic Contact to p-HEMT
Sharma, H.S. ; Mahajan, Somna S. ; Guru, Vandana ; Rawal, D.S. ; Naik, A.A. ; Agarwal, Vanita R. ; Sehgal, B.K. ; Gulati, R. ; Vyas, P.
Pub. info.: Proceedings of the Eleventh International Workshop on the Physics of Semiconductor Devices : (December 11-15, 2001).  VOL-2  pp.918-921,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4746
4.

Conference Proceedings
Conference Proceedings
4. Air - Bridge Interconnection Technology for GaAs MMICs
Naik, A.A. ; Sharma, H.S. ; Prabhakar, S. ; Sehgal, B.K. ; Gulati, R. ; Vyas, H.P. ; Murthy, R. ; Prasad, S.D. ; Rao, A.V.S.K. ; Govindacharyulu, P.A.
Pub. info.: Proceedings of the Eleventh International Workshop on the Physics of Semiconductor Devices : (December 11-15, 2001).  VOL-2  pp.894-897,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4746
5.

Conference Proceedings
Conference Proceedings
5. Development and TCR Control of Nichrome Thin Film Resistors for GaAs MMICs
Vinayak, Seema ; Srivastav, R.D. ; Sehgal, B.K. ; Naik, A.A. ; Prabhakar, Shobha ; Guru, Vandana ; Saravanan, Sai ; Mahajan, Somna ; Agarwal, Vanita R. ; Gulati, R. ; Vyas, H.P.
Pub. info.: Proceedings of the Eleventh International Workshop on the Physics of Semiconductor Devices : (December 11-15, 2001).  VOL-2  pp.936-942,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4746
6.

Conference Proceedings
Conference Proceedings
6. Selective Area n+ Implanted MESFET Process for the Fabrication of MMICs
Sehgal, B.K. ; Naik, A.A, ; Gulati, R. ; Vyas, H.P. ; Kumar, K.C. ; Subraveti, Vijay ; Rao, A.V.S.K. ; Mohan, P. ; Govindacharyulu, P.A.
Pub. info.: Proceedings of the Eleventh International Workshop on the Physics of Semiconductor Devices : (December 11-15, 2001).  VOL-2  pp.842-845,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4746
7.

Conference Proceedings
Conference Proceedings
7. Effect of Ion- Beam Milling on Lips Prior to Lift-Off Process
Bhan, R.K. ; Mittal, V. ; Rawal, D.S. ; Naik, A.A. ; Sehgal, B.K. ; Singh, K.P. ; Singh, B.V. ; Aneja, B.R. ; Sharma, B.L. ; Singh, R. ; Gopal, V.
Pub. info.: Proceedings of the Eleventh International Workshop on the Physics of Semiconductor Devices : (December 11-15, 2001).  VOL-2  pp.1049-1052,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4746
8.

Conference Proceedings
Conference Proceedings
8. Thickness Measurement of Thin Films and Multilayers Using Fourier Transform of X-Ray Reflectivity
Tiwari, U. ; Sharma, R.K. ; Sehgal, B.K. ; Goyal, A. ; Sharma, B.B. ; Kumar, V.
Pub. info.: Proceedings of the Eleventh International Workshop on the Physics of Semiconductor Devices : (December 11-15, 2001).  VOL-2  pp.1014-1017,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4746