1.

Conference Proceedings
Conference Proceedings
1. MEASUREMENTS OF LIGHT-INDUCED DEGRADATION IN a-Si, Ge:H,F ALLOYS
Kolodzey, J. ; Aljishi, S. ; Smith, Z E ; Chu, V. ; Schwartz, R. ; Wagner, S.
Pub. info.: Materials issues in amorphous-semiconductor technology : symposium held April 15-18, 1986, Palo Alto, California, U.S.A..  pp.237-244,  1986.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 70
2.

Conference Proceedings
Conference Proceedings
2. Statistical analysis and ground-based testing of the on-orbit Space Shuttle damage detection sensors
Miles, B. H. ; Tanner, E. A. ; Carter, J. P. ; Kamerman, G. W. ; Schwartz, R.
Pub. info.: Laser rader technology and applications X : 31 March-1 April 2005, Orlando, Florida, USA.  pp.238-249,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5791
3.

Conference Proceedings
Conference Proceedings
3. Stray radiation in ariborne FLIR system
Schwartz, R. ; Bloomberg, S. ; Moin, M. ; Layosh, Y.Z.
Pub. info.: Infrared Technology and Applications XXVIII.  Part Two  pp.676-687,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4820