Xin, S. ; Longenbach, K. F. ; Schwartz, C. ; Jiang, Y. ; Wang, W. I.
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Materials for optical information processing : symposium held May 1-3, 1991, Anaheim, California, U.S.A.. pp.203-212, 1992. Pittsburgh, Pa.. Materials Research Society
Atmospheric propagation II : 29-30 March 2005, Orlando, Florida, USA. pp.38-49, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Russo, O. L. ; Rehn, V. ; Nee, T. W. ; Cole, T. L. ; Theis, W. M. ; Schwartz, C.
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Photo-induced space charge effects in semiconductors: electro-optics, photoconductivity, and the photorefractive effect : symposium held April 29-May 1, 1992, San Francisco, California, U.S.A.. pp.69-74, 1992. Pittsburgh, Pa.. Materials Research Society
Bocelli, S. ; Guizzetti, G. ; Marabelli, F. ; Schwartz, C. ; Goncalves-Conto, S. ; Kanel, H. von
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Silicide thin films - fabrication, properties, and applications : Symposium held November 27-30, 1995, Boston, Massachusetts, USA. pp.631-, 1996. Pittsburgh. MRS - Materials Research Society
Polarization: measurement, analysis, and remote sensing VII : 20-21 April 2006, Kissimmee, Florida, USA. pp.624009-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering