Blank Cover Image

Low-frequency noise and radiation response of buried oxides in SOI nMOS transistors

Author(s):
Publication title:
Noise in Devices and Circuits
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5113
Pub. Year:
2003
Page(from):
44
Page(to):
55
Pages:
12
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819449733 [0819449733]
Language:
English
Call no.:
P63600/5113
Type:
Conference Proceedings

Similar Items:

Fleetwood, D. M., Xiong, H. D., Lin, J. S.

SPIE - The International Society of Optical Engineering

Pasternak, R., Jun, B., Schrimpf, R.D., Fleetwood, D.M., Alles, M.A., Dolan, R.P., Standley, R.W., Tolk, N.H.

Electrochemical Society

Fleetwood, D.M.

SPIE-The International Society for Optical Engineering

8 Conference Proceedings SOI Wafers with Buried Cavities

Suni, T., Henttinen, K., Dekker, J., Luoto, H., Kulawski, M., Makinen, J., Mutikainen, R.

Electrochemical Society

Cirba, C.R., Cristoloveanu, S., Schrimpf, R.D., Feldman, L.C., Fleetwood, D.M., Galloway, K.F.

Electrochemical Society

Deen, M.J., Rumyantsev, S.L., Glick, I., Smozh, A., Westcott, M., Waechter, D.

Electrochemical Society

Felix, J. A., Shaneyfelt, M. R., Schwank, J. R., Dodd, P. E., Fleetwood, D. M., Zhou, X. J., Gusev, E. P.

Springer

Jomaah, J., Balestra, F.

SPIE-The International Society for Optical Engineering

Tseng, T., Woo, J. C. S.

SPIE - The International Society of Optical Engineering

M.I. Idris, M.H. Weng, H.K. Chan, A.E. Murphy, D.A. Smith, R.A.R. Young, E.P. Ramsay, D.T. Clark, N.G. Wright, A.B. …

Trans Tech Publications

Hovel, H.J., Ahnonte, M., Lee, J.D, Sadana, D., Domenicucci, A., Bettinger, J.

Electrochemical Society

Kim, H-K, Lee, J-W, Lee, W-H, Oh, M-R, Koh, Y-H

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12