1.

Conference Proceedings
Conference Proceedings
1. Optical characteristics of nanostructured III-V compounds
Tiginyany, I.M. ; Schwab, C. ; Sarua, A. ; Irmer, G. ; Monecke, J. ; Kravetshy, I. ; Sigmund, J. ; Hartnagel, N.L.
Pub. info.: Frontiers of Nano-Optoelectronic Systems.  pp.393-404,  2000.  Dordrecht, MA.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 6
2.

Conference Proceedings
Conference Proceedings
2. *STRUCTURE AND METALSTABILITY OF MUONIUM CENTERS IN SEMICONDUCTORS AND THEIR SIMULATION OF ISOLATED HYDROGEN CENTERS
Estle, T.L. ; Kiefl, R.F. ; Schneider, J.W. ; Schwab, C.
Pub. info.: Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.407-418,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 163
3.

Conference Proceedings
Conference Proceedings
3. Porosity-Induced Optical Phonon Engineering in III-V Compounds
Tiginyanu, I. M. ; Irmer, G. ; Monecke, J. ; Hartnagel, H. L. ; Vogt, A. ; Schwab, C. ; Grob, J-J.
Pub. info.: Microcrystalline and nanocrystalline semiconductors--1998 : symposium held November 30-December 3, 1998, Boston, Massachusetts, U.S.A..  pp.99-,  1999.  Warrendale, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 536
4.

Conference Proceedings
Conference Proceedings
4. Residual defects in virgin and implanted Si after laser processing
Mesli, A. ; Goltzene, A. ; Muller, J.C. ; Meyer, B. ; Schwab, C. ; Siffert, P.
Pub. info.: Laser and electron-beam interactions with solids : proceedings of the Materials Research Society Annual Meeting, November 1981, Boston Park Plaza Hotel, Boston, Massachusetts, U.S.A..  pp.349-354,  1982.  New York.  North Holland
Title of ser.: Materials Research Society symposia proceedings
Ser. no.: 4
5.

Conference Proceedings
Conference Proceedings
5. NON-DESTRUCTIVE OPTICAL ANALYSIS OF IMPLANTED LAYERS IN GaAs BY RAMAN SCATTERING AND SPECTROSCOPIC ELLIPSOMETRY
Biellmann, J. ; Prevot, B. ; Schwab, C. ; Theeten, J. B. ; Erman,. M.
Pub. info.: Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A..  pp.517-522,  1983.  New York.  North-Holland
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 14