1.

Conference Proceedings
Conference Proceedings
1. New Level of Thermal Management in Vertical CVD Rotating Disk Reactor Technology
Gurary, A.I. ; Tompa, G.S. ; Thompson, A.G. ; Stall, R.A. ; Kroll, W.J. ; Schumaker, N.E.
Pub. info.: Proceedings of the Twenty-first State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXI).  pp.78-84,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-34
2.

Conference Proceedings
Conference Proceedings
2. Imprint lithography: lab curiosity or the real NGL (Keynote Address)
Resnick, D.J. ; Dauksher, W.J. ; Mancini, D.P. ; Nordquist, K.J. ; Bailey, T.C. ; Johnson, S.C. ; Stacey, N.A. ; Ekerdt, J.G. ; Willson, C.G. ; Sreenivasan, S.V. ; Schumaker, N.E.
Pub. info.: Emerging Lithographic Technologies VII.  1  pp.12-23,  2003.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5037
3.

Conference Proceedings
Conference Proceedings
3. Design and performance of a step and repeat imprinting machine
McMackin, I. ; Schumaker, P. ; Babbs, D. ; Choi, J. ; Collison, W. ; Sreenivasan, S.V. ; Schumaker, N.E. ; Watts, M.P.C. ; Voisin, R.D.
Pub. info.: Emerging Lithographic Technologies VII.  1  pp.178-186,  2003.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5037
4.

Conference Proceedings
Conference Proceedings
4. Cost of ownership analysis for patterning using step and flash imprint lithography
Sreenivasan, S.V. ; Willson, C.G. ; Schumaker, N.E. ; Resnick, D.J.
Pub. info.: Emerging Lithographic Technologies VI.  Part Two  pp.903-909,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4688
5.

Conference Proceedings
Conference Proceedings
5. Low-cost nanostructure patterning using step and flash imprint lithography
Sreenivasan, S.V. ; Willson, C.G. ; Schumaker, N.E. ; Resnick, D.J.
Pub. info.: Nanostructure Science, Metrology, and Technology.  pp.187-194,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4608