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11 results

Conference Proceedings

1. Compensation of chromatic dispersion and polarization mode dispersion in optical transmission systems (Invited Paper)

Meissner, P. M. ; Merker, T. ; Schumacher, K. ; Boehm, S.

Pub. info.:	Active and passive optical components for WDM communications III : 8-11 September, 2003, Orlando, Florida, USA. pp.721-730, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5246

Conference Proceedings

2. Pore structural characteristics of mesostructured materials prepared under different conditions

Candeias, A.E. ; Carrott, M.M.L. Ribeiro ; Carrott, P.J.M. ; Schumacher, K. ; Grun, M. ; Unger, K.K.

Pub. info.:	Characterization of porous solids VI : proceedings of the 6th International Symposium on the Characterization of Porous Solids (COPS-VI), Alicante, Spain, May 8-11, 2002. pp.363-370, 2002. Amsterdam. Elsevier
Title of ser.:	Studies in surface science and catalysis
Ser. no.:	144

Conference Proceedings

3. Rational design, tailored synthesis and characterisation of ordered mesoporous silicas in the micron and submicron size range

Grun, M. ; Buchel, G. ; Kumar, D. ; Schumacher, K. ; Bidlingmaier, B. ; Unger, K. K.

Pub. info.:	Characterisation of porous solids V : proceedings of the 5th International Symposium on the Characterisation of Porous Solids (COPS-V), Heidelberg, Germany, May 30-June 2, 1999. pp.155-, 2000. New York. Elsevier
Title of ser.:	Studies in surface science and catalysis
Ser. no.:	128

Technical Paper

4. Design for Lean Manufacturing.

Hines, S. ; Schumacher, K. ; Becker, T.M. ; Tiem, D.V.

Pub. info.:	2003 SAE world congress : technical paper. 2003. Warrendale, Penn.. Society of Automotive Engineers
Title of ser.:	Society of Automotive Engineers technical paper series
Ser. no.:	2003

Conference Proceedings

5. Optical and electrical approaches for reduction of polarization mode dispersion limitations (Invited Paper)

Schumacher, K. ; Boehm, S. ; Merker, T. ; Meissner, P.

Pub. info.:	Optical Transmission Systems and Equipment for WDM Networking III. pp.135-148, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5596

Conference Proceedings

6. Overlay improvement by non-linear error correction and non-linear error control by APC [6152-156]

Choi, D. ; Jahnke, A. ; Schumacher, K. ; Hoepfl, M.

Pub. info.:	Metrology, Inspection, and Process Control for Microlithography XX. pp.61523W-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6152

Conference Proceedings

7. Methods for in-service measurement of polarization mode dispersion (Invited Paper) [6388-25]

Boehm, S. ; Schumacher, K. ; Meissner, P.

Pub. info.:	Optical Transmission Systems and Equipment for Networking V. pp.63880M-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6388

Conference Proceedings

8. Compensation of chromatic dispersion and polarization mode dispersion in optical transmission systems (Invited Paper)

Meissner, P. M. ; Merker, T. ; Schumacher, K. ; Boehm, S.

Pub. info.:	Optical Transmission Systems and Equipment for WDM Networking II. pp.71-80, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5247

Conference Proceedings

9. Comparison and optimization of the transmission performances of various advanced modulation formats in high bit rate systems [6388-19]

Maiga, B. I. ; Schumacher, K. ; Meissner, P.

Pub. info.:	Optical Transmission Systems and Equipment for Networking V. pp.63880G-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6388

10.

Conference Proceedings

10. Advances in process overlay on 300-mm wafers

Staecker, J. ; Arendt, S. ; Schumacher, K. ; Mos, E.C. ; van Haren, R.J. ; van der Schaar, M. ; Edart, R. ; Demmerie, W. ; Tolsma, H.

Pub. info.:	Metrology, Inspection, and Process Control for Microlithography XVI. Part Two pp.927-936, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4689

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