1.

Conference Proceedings

Conference Proceedings
Greve, D.W. ; Misra, R. ; Strong, R. ; Schlesinger, T.E.
Pub. info.: Infrared detectors : materials, processing, and devices : symposium held April 14-16, 1993, San Francisco, California, U.S.A..  pp.267-272,  1994.  Pittsburgh, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 299
2.

Conference Proceedings

Conference Proceedings
Hunt, B.D. ; Schowalter, L.J. ; Lewis, N. ; Hall, E.L. ; Hauenstein, R.J. ; Schlesinger, T.E. ; McGill, T.C. ; Okamoto,Masako ; Hashimoto, Shin
Pub. info.: Thin films : interfaces and phenomena : symposium held December 2-6, 1985, Boston, Massachusetts, USA.  pp.479-484,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 54
3.

Conference Proceedings

Conference Proceedings
Bao, X.J. ; Schlesinger, T.E. ; James, R.B. ; Cheng, A.Y. ; Ortale, C. ; van den Berg, L.
Pub. info.: Defects in materials : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A..  pp.541-546,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 209
4.

Conference Proceedings

Conference Proceedings
Bao, X.J. ; Schlesinger, T.E. ; James, R.B. ; Cheng, A.Y. ; Ortale, C. ; van den Berg, L.
Pub. info.: Wide band gap semiconductors : symposium held December 2-6, 1991, Boston, Massachusetts, U.S.A..  pp.767-772,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 242
5.

Conference Proceedings

Conference Proceedings
Schlesinger, T.E. ; Lee, Jyh-Chewn ; Kuech, T.F.
Pub. info.: Interfaces, superlattices, and thin films : symposium held December 1-6, 1986, Boston, Massachusetts, U.S.A..  pp.241-246,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 77
6.

Conference Proceedings

Conference Proceedings
Bao, X.J. ; Schlesinger, T.E. ; James, R.B. ; Cheng, A.Y. ; Ortale, C.
Pub. info.: Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.1027-1030,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 163
7.

Conference Proceedings

Conference Proceedings
Wong, D. ; Schlesinger, T.E. ; Milnes, A.G.
Pub. info.: Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.997-1000,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 163
8.

Conference Proceedings

Conference Proceedings
Fang, Zhaoqiang, ; Shan, Lei ; Schlesinger, T.E. ; Milnes, A.G.
Pub. info.: Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.189-192,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 163
9.

Conference Proceedings

Conference Proceedings
Itagi, A.V. ; Schlesinger, T.E. ; Bain, J.A. ; Stancil, D.D.
Pub. info.: Optical data storage 2003 : 11-14 May 2003, Vancouver, British Columbia, Canada.  pp.341-344,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5069
10.

Conference Proceedings

Conference Proceedings
Chen, F. ; Itagi, A. ; Stebounova, L. ; Bain, J.A. ; Stancil, D.D. ; Walker, G.C. ; Schlesinger, T.E.
Pub. info.: Optical data storage 2003 : 11-14 May 2003, Vancouver, British Columbia, Canada.  pp.312-318,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5069