Optical manufacturing and testing V : 3-5 August 2003, San Diego, California, USA. pp.81-88, 2003. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Schindler, A. ; Haensel, T. ; Nickel, A. ; Thomas, H.-J. ; Lammert, H. ; Siewert, F.
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Optical manufacturing and testing V : 3-5 August 2003, San Diego, California, USA. pp.64-72, 2003. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Optical manufacturing and testing V : 3-5 August 2003, San Diego, California, USA. pp.73-80, 2003. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Herold, V. ; Lammert, H. ; Schindler, A. ; Schwennicke, R. ; Siewert, F.
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Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany. pp.596521-596521, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Siewert, F. ; Lammert, H. ; Noll, T. ; Schlegel, T. ; Zeschke, T. ; Hansel, T. ; Nickel, A. ; Schindler, A. ; Grubert, B. ; Schlewitt, C.
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Advances in metrology for x-ray and EUV optics : 2-3 August 2005, San Diego, California, USA. pp.592101-592101, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Otte, K. ; Lippold, G. ; Grambole, D. ; Herrmann, F. ; Schlemm, H. ; Schindler, A. ; Bigl, F.
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Hydrogen in semiconductors and metals : symposium held April 13-17, 1998, San Francisco, California, U.S.A.. pp.275-, 1998. Warrendale, Penn.. MRS - Materials Research Society
Twerdowski, E. ; Wannemacher, R. ; Schindler, A. ; Razek, N. ; Grill, W.
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Health monitoring and smart nondestructive evaluation of structural and biological systems IV : 7-9 March 2005, San Diego, California, USA. pp.204-211, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Kurtz, R. M. ; Pradhan, R. D. ; Aye, T. M. ; Chua, K. -B. ; Tengara, I. ; Tun, N. ; Win, T. ; Holmstedt, J. ; Schindler, A. ; Hergert, S.
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Helmet- and head-mounted displays X : technologies and applications : 28-29 March, 2005, Orlando, Florida, USA. pp.130-137, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Razek, N. ; Schindler, A. ; Hirsch, D. ; Wagner, G. ; Gottschalch, V. ; Rauschenbach, B.
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Semiconductor wafer bonding : science, technology, and applications : proceedings of the international symposia. pp.406-413, 2005. Pennington, NJ. Electrochemical Society