1.

Conference Proceedings
Conference Proceedings
1. *THE EFFECT OF SPUTTERING CONDITIONS ON SUBMICRON CONTACT FILLING USING LASER PLANARIZATION
Yu, C. ; Doan, T.T. ; Kim, S. ; Sandhu, G.S.
Pub. info.: Electronic packaging materials science V : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A..  pp.357-368,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 203
2.

Conference Proceedings
Conference Proceedings
2. DOING OF DIAMOND OF CO-IMPLANTATION WITH DOPANT ATOMS AND CARBON
Sandhu, G.S. ; Kao, C.T. ; Swanson, M.L. ; Chu, W.K.
Pub. info.: Diamond, silicon carbide, and related wide bandgap semiconductors : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.321-326,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 162
3.

Conference Proceedings
Conference Proceedings
3. ION IMPLANTATION OF BORON IN DIAMOND
Sandhu, G.S. ; Swanson, M.L. ; Chu, W.K.
Pub. info.: Processing and characterization of materials using ion beams : symposium held November 28-December 2, 1988, Boston, Massachusetts, U.S.A..  pp.707-712,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 128
4.

Conference Proceedings
Conference Proceedings
4. REGROWTH OF DAMAGED LAYERS IN DIAMOND PRODUCED BY ION IMPLANTATION
Sandhu, G.S. ; Liu, B. ; Parikh, N.R. ; Hunn, J.D. ; Swanson, M.L. ; Wichert, Th. ; Deicher, M. ; Skudlik, H. ; Lennard, W.N. ; Mitchell, I.V.
Pub. info.: Diamond, silicon carbide, and related wide bandgap semiconductors : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.189-194,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 162
5.

Conference Proceedings
Conference Proceedings
5. RBS/CHANNELING AND TEN ANALYSIS OF THIN SANDWICHED EPI-LAYERS OF GERMANIUM ON SILICON
Swanson, M.L. ; Parikh, N.P. ; Frey, E.C. ; Sandhu, G.S. ; Chu, W.K. ; Baribeau, J.-M. ; Song, Kechang ; McCaffrey, J. ; Jackman, T.E.
Pub. info.: Characterization of the structure and chemistry of defects in materials : symposium held November 28-December 3, 1988, Boston, Massachusetts, U.S.A..  pp.581-586,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 138