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13 results

Conference Proceedings

1. Electronic Structure of C and Si Fullerenes and Fullerides

Saito,S.

Pub. info.:	Cluster assembled materials. pp.233-246, 1996. Zuerich-Uetikon, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	232

Conference Proceedings

2. Micro-object handling under SEM by vision-based automatic control

Kasaya,T. ; Miyazaki,H. ; Saito,S. ; Sato,T.

Pub. info.:	Microrobotics and micromanipulation : 4-5 November 1998, Boston, Massachusetts. pp.181-192, 1998. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3519

Conference Proceedings

3. A Method for Determining the Impact Force in Crash Testing

Fujii,Y. ; Isobe,D. ; Saito,S. ; Fujimoto,H. ; Miki,Y.

Pub. info.:	Proceedings of the IMAC-XVIII: a conference on structural dynamics, February 7-10, 2000, the Westin La Cantera Resort, San Antonio, Texas. Part2 pp.1672-1677, 2000. Bethel, CT. Society for Experimental Mechanics
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4062

Conference Proceedings

4. The Mt.Fuji submillimeter-wave telescope

Sekimoto,Y. ; Arikawa,Y. ; Aso,Y. ; Fujiwara,H. ; Ikeda,M. ; Inatani,J. ; Ito,T. ; Iwata,M. ; Kamegai,K. ; Maezawa,H. ; Noguchi,T. ; Ohishi,M. ; Oka,T. ; Ozeki,H. ; Saito,S. ; Sakai,T. ; Shi,S.-C. ; Tatematsu,K. ; Yamamoto,S.

Pub. info.:	Radio telescopes : 27 - 30 March 2000 Munich, Germany. pp.185-196, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4015

Conference Proceedings

5. Advanced materials for 193-nm resists

Ushirogouchi,T. ; Asakawa,K. ; Shida,N. ; Okino,T. ; Saito,S. ; Funaki,Y. ; Takaragi,A. ; Tsutsumi,K. ; Nakano,T.

Pub. info.:	Advances in resist technology and processing XVII : 28 February - 1 March 2000, Santa Clara, USA. Part2 pp.1147-1156, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3999

Conference Proceedings

6. Effect of base additive on process latitude in chemically amplified electron-beam resists

Saito,S. ; Kihara,N. ; Naito,T. ; Nakase,M. ; Nakasugi,T. ; Kato,Y.

Pub. info.:	Advances in resist technology and processing XIV : 10-12 March 1997, Santa Clara, California. pp.659-666, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3049

Conference Proceedings

7. 630-nm laser diode array for laser-beam printer formed by impurity diffusion

Nakatsuka,S. ; Saito,S.

Pub. info.:	In-plane semiconductor lasers III : 27-29 January 1999, San Jose, California. pp.196-202, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3628

Conference Proceedings

8. 3D stress analysis by scattered light photoelasticity

Saito,S. ; Yoneyama,S. ; Takashi,M.

Pub. info.:	Second International Conference on Experimental Mechanics : 29 November-1 December 2000, Singapore. pp.135-140, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4317

Conference Proceedings

9. Si selective epitaxial growth technology using UHV-CVD and its application to LSI fabrication (Invited Paper)

Shishiguchi,S. ; Yasunaga,T. ; Aoyama,T. ; Tatsumi,T. ; Saito,S.

Pub. info.:	Microelectronic Device Technology : 1-2 October 1997, Austin, Texas. pp.106-117, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3212

10.

Conference Proceedings

10. TDS and RBS Studies of Ar Implanted to Si

Hanada,R. ; Saito,S. ; Nagata,S. ; Yamaguchi,S. ; Shinozuka,T. ; Fujioka,M.

Pub. info.:	Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.1375-1380, 1995. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	196-201

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Author: Saito,S.