1.

Conference Proceedings
Conference Proceedings
1. Effect of Gate Metallisation Technique on MESFET Performance
Rawal,D.S. ; Naik,A.A. ; Vinayak,S. ; Sharma,H.S. ; Sehgal,B.K. ; Sai Saravanan,G. ; Mohan,S. ; Gulati,R.
Pub. info.: Physics of - Semiconductor Devices -.  Part 2  pp.1314-1317,  1998.  New Delhi.  Narosa Publishing House
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3316
2.

Conference Proceedings
Conference Proceedings
2. Characterisation of Ion Implanted Layers in GaAs and Influence of Various Parameters on Device Performance
Bhattacharya,B. ; Sai Saravanan,G. ; Khatri,R.K. ; Naik,A.A. ; Rawal,D.S. ; Sharma,H.S. ; Sehgal,B.K. ; Gulati,R. ; Vyas,H.P. ; Kumar,K.C. ; Rao,A.V.S.K. ; Govindacharyulu,P.A.
Pub. info.: Physics of - Semiconductor Devices -.  Part 2  pp.1310-1313,  1998.  New Delhi.  Narosa Publishing House
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3316