1.

Conference Proceedings
Conference Proceedings
1. Oxygen Precipitation Behavior and its Optimum Condition for Internal Gettering and Mechanical Strength in Epitaxial and Polished Silicon Wafers
Sueoka,K. ; Akatsuka,M. ; Onno,T. ; Asayama,E. ; Koike,Y. ; Adachi,N. ; Sadamitsu,S. ; Katahama,H.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.164-179,  2000.  Pennington, N.J., Bellingham, Wash..  Electrochemical Society — SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4218
2.

Conference Proceedings
Conference Proceedings
2. Growth Parameters Determining the Type of Grown-in Defects in Czochralski Silicon Crystals
Hourai,M. ; Kajita,E. ; Nagashima,T. ; Fujiwara,H. ; Sadamitsu,S. ; Miki,S. ; Shigematsu,T.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1713-1718,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201