1.

Conference Proceedings
Conference Proceedings
1. CHARACTERIZATION OF VACANCY DEFECTS IN As-GROWN AND ELECTRON IRRADIATED GaAs BY POSITRON ANNIHILATION.
STUCKY,M. ; CORBEL,C. ; GEFFROY,B.
Pub. info.: Defects in Semiconductors : Proceedings of the 14th International Conference on Defects in Semiconductors, ICDS-14, Paris, France, August 18-22, 1986.  Part1  pp.265-270,  1986.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 10-12
2.

Conference Proceedings
Conference Proceedings
2. DETECTION OF NON STOICHIOMETRIC VACANCY DEFECTS IN CdTe,HgTe AND Hg1-x CdxTe BY POSITRON ANNIHILATION.
GEFFROY,B. ; CORBEI,C. ; STUCKY,M. ; TRIBOULET,R. ; HAU-TOJARVI,P. ; PLAZAOLA,F. ; SAARINEN,K. ; RAJAINMAKI,H. ; AALTONEN,J. ; MOSER,P. ; SENGUPTA,A. ; PAUTRAT,J.L.
Pub. info.: Defects in Semiconductors : Proceedings of the 14th International Conference on Defects in Semiconductors, ICDS-14, Paris, France, August 18-22, 1986.  Part3  pp.1241-1246,  1986.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 10-12