1.

Conference Proceedings
Conference Proceedings
1. Stability Analysis of the Interface Between Electrical Contact Layers and Metal Interconnects in Solid Oxide Fuel Cells
S. Shim ; D. B. Mumm
Pub. info.: Solid oxide fuel cells 10 (SOFC-X).  pp.795-804,  2007.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 7(1)
2.

Conference Proceedings
Conference Proceedings
2. Gate Quality AlO3 by Molecular-Atomic-Deposition (MAD) and its Potential Applications in III-V Semiconductor CMOS Technology
S. Cui ; N. Li ; J. Zheng ; S. Shim ; T. Ma
Pub. info.: Advanced gate stack, source/drain and channel engineering for Si-based CMOS 3 : new materials, processes and equipment.  pp.321-330,  2007.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 6(1)
3.

Conference Proceedings
Conference Proceedings
3. Wavelet and PCA-based approach for 3D shape recovery from image focus
M. T. Mahmood ; S. Shim ; T.-S. Choi
Pub. info.: Applications of digital image processing XXXI.  pp.70731S-1-70731S-9,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 7073
4.

Conference Proceedings
Conference Proceedings
4. Optimization of mask manufacturing rule check constraint for model based assist feature generation
S. Shim ; Y. Kim ; Y. Chun ; S. Lee
Pub. info.: Lithography Asia 2008.  2  pp.714030-1-714030-9,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 7140
5.

Conference Proceedings
Conference Proceedings
5. Study of the mask topography effect on the OPC modeling of hole patterns
S. Shim ; Y. Kim ; S. Lee ; S. Choi ; W. Han
Pub. info.: Optical Microlithography XXI.  3  pp.69243R-1-69243R-8,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6924