1.

Conference Proceedings
Conference Proceedings
1. HELIOSEISMOLOGY FROM THE BLUE AND RED WINGS OF THE NA PROFILE AS SEEN BY GOLF
R. A. García ; S. J. Jiménez-Reyes ; S. Turck-Chièze ; S. Mathur
Pub. info.: Proceedings of the SOHO 14/GONG 2004 Workshop : helio- and astroseismology: towards a golden and future, 12-16 July 2004, New Haven, Connecticut, USA..  pp.432-435,  2004.  Noordwijk, The Netherlands.  ESA Publications Division
Title of ser.: ESA SP
Ser. no.: 559
2.

Conference Proceedings
Conference Proceedings
2. Sensitivity of the predicted frequencies of l = 1 gravity modes to known physical processes
S. Mathur ; S. Turck-Chièze ; S. Couvidat ; R. A. Garcia
Pub. info.: Proceedings of SOHO 18, GONG 2006, HELAS I, beyond the spherical sun, 7-11 August 2006, Sheffield, UK.  2006.  Noordwijk, The Netherlands.  ESA Publications Division
Title of ser.: ESA SP
Ser. no.: 624
3.

Conference Proceedings
Conference Proceedings
3. Chemical Nanotechnology: From Molecules to Applications
S. Mathur ; H. Shen ; N. Donia
Pub. info.: Nanostructured Metal Oxides : Processing and Applications.  pp.3-13,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 3(9)
4.

Technical Paper
Technical Paper
4. A Next Generation DBNS Solver: Accurate Solutions and Fast Multigrid Driven Convergence
D. Caraeni ; S. Mathur ; L. Zori
Pub. info.: AIAA meeting papers on disc.  2007.  Reston, Va..  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA Computational Fluid Dynamics Conference
Ser. no.: 2007
5.

Conference Proceedings
Conference Proceedings
5. 45nm design rule in-die overlay metrology on immersion lithography processes
Y. Shih ; G. K. Huang ; C. Yu ; M. Adel ; C. K. Huang ; P. Izikson ; E. Kassel ; S. Mathur ; C. Huang ; D. Tien ; Y. Avrahamov
Pub. info.: Metrology, inspection, and process control for microlithography XXI.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6518