1.
|
Technical Paper
|
Y. Park ; J. Kim ; S. Jun ; D. Lee ; M. Kwak ; D-H. Lee
Pub. info.: |
AIAA meeting papers on disc. 2008. Reston, Va.. American Institute of Aeronautics and Astronautics |
Title of ser.: |
AIAA Paper : Multidisciplinary Analysis and Optimization Conference |
Ser. no.: |
2008 |
|
2.
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Conference Proceedings
|
Y. Jeon ; S. Jun ; J. Kang ; S. Lee ; J. Kim ; K. Kim
Pub. info.: |
Metrology, inspection, and process control for microlithography XXI. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering |
Title of ser.: |
Proceedings of SPIE - the International Society for Optical Engineering |
Ser. no.: |
6518 |
|
3.
|
Conference Proceedings
|
S. Jun ; J. Kim ; E. Jeong ; Y. Yun ; K. Kim
Pub. info.: |
Metrology, inspection, and process control for microlithography XXI. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering |
Title of ser.: |
Proceedings of SPIE - the International Society for Optical Engineering |
Ser. no.: |
6518 |
|
4.
|
Conference Proceedings
|
S. Jun ; E. Jeong ; Y. Yun ; K. Choi ; J. Kim
Pub. info.: |
Optical Microlithography XXI. 2 pp.692439-1-692439-8, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers |
Title of ser.: |
Proceedings of SPIE - the International Society for Optical Engineering |
Ser. no.: |
6924 |
|