1.

Conference Proceedings
Conference Proceedings
1. EBIC INVESTIGATION OF ETCH INDUCED DEFECTS IN SILICON INTRODUCED BY RIE AND RIBE
Habermeier, H. -U. ; Eckstein, M. ; Ruf, C. ; Jager-Waldau, G. ; Zwicker, G.
Pub. info.: Photons and low energy particles in surface processing : symposium held Decmber[i.e. December] 3-6, 1991, Boston, Massachusetts, U.S.A..  pp.211-216,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 236
2.

Conference Proceedings
Conference Proceedings
2. Millimeter-wove array receivers for remote sensing (Invited Paper) [6410-1 7]
Gajer, T. ; Kangaslahti, P. ; Tanner, A. ; Lambrigtsen, B. ; Brown, S. ; Dawson, D. ; Weinreb, S. ; Wilson, W.J. ; Lim, B. ; Ruf, C. ; Piepmeier, J.
Pub. info.: Microwave remote sensing of the atmosphere and environment V : 15-16 November 2006, Goa, India.  pp.64100G-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6410